Magellan 400 microscope

TEM and EDS were analyzed for microstructure and composition on the JEM-2100F electron microscope operated at 200 kV. STEM and element mapping scanning were obtained on field-emission Magellan 400 microscope under the FEI Company. XRD pattern was recorded on a Rigaku D/MAX-2200 PC XRD system. XPS spectrum was recorded on ESCAlab250 (Thermal Scientific). DLS and Zeta potential were tested on Zetasizer Nanoseries (Nano ZS90, Malvern Instrument Ltd.). AFM images were collected on the Veeco DI Nanoscope Multi Mode V system. UV-vis-NIR absorption spectra were recorded on UV-3101 Shimadzu UV-vis-NIR spectrometer. FTIR pattern was recorded for the analysis of chemical bonds. The quantitative analysis of Fe element was conducted on inductively coupled plasma-optical emission spectrometry (ICP-OES, Agilent 725, Agilent Technologies). Raman spectroscopy pattern was collected on a DXR Raman microscope (Thermal Scientific, USA). ESR spectrum was measured using DMPO as the nitrogen trapping agent by Bruker EMX1598 spectrometer.

High-resolution TEM (Tecnai G2 F20, FEI) was used to observe the morphology and perform element mapping at an operating voltage of 200 kV. At room temperature, the particle size and zeta potential were determined via dynamic light scattering (Nano-Zetasizer ZS90, Malvern, UK). XPS was performed using an ESCALAB-250Xi system (Thermal Scientific, US). SEM photographs were recorded using a field-emission Magellan 400 microscope (FEI Company, US). X-ray diffraction was performed using a MiniFlex 600 diffractometer (Rigaku, Japan). Flow cytometry data were obtained using the CytoFLEX LX instrument.

Transmission electron microscopy (TEM) images were acquired on a JEOL-2100F transmission electron microscope. Scanning electron microscopy (SEM) images and corresponding element mapping scanning were acquired on a field-emission Magellan 400 microscope (FEI Company, USA). The quantitative analysis of the Si element was determined by inductively coupled plasma mass spectrometry (ICP-MS, NexION 2000B, PerkinElmer, US). Confocal laser scanning microscopy (CLSM) images were acquired by FV1000 (SP8, Leica, US). Nitrogen adsorption–desorption isotherms were recorded at liquid nitrogen temperature with an ASAP 2020 adsorption analyzer (Micromeritics).

The morphology and composition of the CaGe₂ and H‐germanene precursors were determined using a JEM‐2100F transmission electron microscope (200 kV), JEOL ARM‐300F with spherical aberration correction (300 kV), and a field‐emission Magellan 400 microscope (FEI Company). XRD was performed using a Rigaku D/MAX‐2200 PC XRD system (Cu K_α, λ = 1.54 Å, 40 mA, and 40 kV). CLSM images were obtained using an FV1000 microscope (Olympus Company, Japan). AFM images were acquired using a Veeco DI Nanoscope Multi‐Mode V system. UV–vis–NIR absorption spectra were measured using a UV‐3600 Shimadzu UV–vis–NIR spectrometer. Quantitative analysis of the elements was performed using ICP‐OES (Agilent 725, Agilent Technologies, US). The ESR tests were performed using a JEOL‐FA200 ESR spectrophotometer. Infrared and Raman spectra were collected using a Nicolet iS10 FTIR spectrometer and LABRAM HR Evolution (532 nm), respectively.