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Evo 15 scanning electron microscope

Manufactured by Zeiss
Sourced in Germany

The Evo 15 is a scanning electron microscope (SEM) manufactured by Zeiss. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The Evo 15 uses a focused beam of electrons to scan the surface of a sample, generating detailed images and data about the sample's topography and composition.

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4 protocols using evo 15 scanning electron microscope

1

Characterization of Prepared Microspheres

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The FT-IR spectra were acquired from 4000 to 400 cm−1 at a resolution of 4 cm−1, using a Bruker Vertex 70 FT-IR spectrometer, Germany. XRD analyses were performed on a Shimadzu machine (XRD-6000 series) with Cu-Kα radiation (λ = 1.54 A), operated at 40 kV and 30 mA. XRD patterns were recorded in the range of 2θ = 4–90° (by steps of 0.02°). Scanning Electron Microscopy (SEM) was used to capture the images of the prepared microspheres on each stage. Images were captured using Zeiss evo 15 scanning electron microscope (Germany). Microspheres were placed on brass stubs using double-sided adhesive tape and coated with a thin layer of gold under reduced pressure. The images were captured at magnifications of 400 and 5000× using an electron beam high voltage of 20 kV.
The mean particle sizes and zeta potentials of the prepared biocarriers were determined by Dynamic light scattering (DLS) using a PSSNICOMP particle sizer 380ZLS (PSS-NICOMP, Santa Barbara, CA, USA). The zeta potential measurements were performed by applying an electric field of strength 10 V cm−1 using three 30 s cycles. The results were outlined as a mean result of at least five readings on triplicate samples.
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2

Multimodal Imaging of Modified Pencil Lead Electrodes

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Bright-field color images of the modified pencil lead electrodes were acquired using a Distamax K2 long distance microscope (Centennial, USA) coupled to a Canon EOS Rebel T5 DSLR camera (Melville, USA). Fluorescence images were obtained using a Nikon Ti-U inverted microscope (Melville, USA) equipped with the Chroma 49002 filter set (450–490 nm exc., 500–550 nm emi. and 495 nm dichroic, Bellows Falls, VT, USA) and registered in a monochromatic Qimaging optiMOS camera (Surrey, Canada) through a 4× objective. Fluorescence images were acquired at different focal planes and stitched together using the Extended Depth of Field plugin [41 ] for ImageJ (version 1.52a) [42 (link)]. Scanning electron microscopy (SEM) and energy dispersive X-ray (EDX) mapping were performed in a Zeiss EVO 15 Scanning Electron Microscope (Jena, Germany). Samples were conductive enough that they did not require Au coating to avoid charging.
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3

Synthesis and Characterization of TiO2 Nanoparticles

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TiO2 NPs were produced by a sol-gel method. In a typical process, 8 ml Titanium Isopropoxide was added dropwise into a mixture of distilled water and isopropyl alcohol. The volume ratio of isopropyl alcohol and water was (1:10). The suspension has been left for strong magnetic stirring up to 4 h. Afterward hydrothermal treatment at 100 °C for 2 h has been done in a Teflon-Lined (TL) stainless-steel (SS) autoclave. Obtained precipitates were then centrifuged, collected, and dried at 100 °C for 5 h to obtain undoped TiO2 nanoparticles. The synthesized nanoparticles were then milled with the help of mortar and pestle and, calcined in air at atmospheric pressure and temperature of 400 °C for 3 h. Fig. 1 demonstrates the preparation of TiO2 NPs.

Preparation of TiO2 NPs.

Fig. 1
In this work, the fourier transform infrared spectroscopy (FT-IR, Nicolet 370) was used. The photoluminescence (PL) spectrums were analyzed with Hitachi F-7000 Spectro fluorimeter at the excitation wavelength of 350 nm. Zeiss EVO 15 scanning electron microscope (SEM) was used for elemental analysis, it was equipped with an energy dispersive spectrometer (EDS) system. Proto x-ray diffraction system in coupled (θ-θ) scan mode using Cu-Kα (1.54 A°) radiation source with an accelerating tube current of 30 mA and voltage of 40 kV at room temperature.
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4

Rheological and Morphological Characterization

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Specimens intended for rheological characterization have been produced by compression molding by using a hot-plates press Collin P (Maitenbeth, Germany). The specimens (25 mm diameter, 1 mm thickness) were obtained at 190 °C, with a pressure of 100 bar for 2 min.
Rheological analyses have been carried out by means of an ARES (TA Instrument, New Castle, DE, USA) strain-controlled rheometer in parallel plate geometry. Complex viscosity values were measured by performing dynamic frequency sweep tests at 190 °C from 0.01 to 100 rad/s under a nitrogen atmosphere.
EVO 15 Scanning Electron Microscope (SEM, beam voltage: 20 kV; working distance: 8.5 mm) by Zeiss (Oberkochen, Germany) was used to carry out the morphological characterization of the samples and to verify the dispersion and distribution of the nanofiller. The specimens (either extrudates or samples collected in zones A and B) were fractured in liquid nitrogen, then the obtained surfaces were covered with a sputtered gold layer and analyzed.
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