Morphology of MTX-NPs was observed under scanning electron microscope (JSM–6360LV Scanning Microscope; Jeol, Tokyo, Japan). A dispersion of NPs was dried on an aluminum stub overnight under vacuum and gold sputtering coating was carried out using a gold sputter module with high-vacuum evaporator (JFC–1100 fine coat ion sputter; Jeol, Tokyo, Japan). Photomicrographs of coated samples were taken after scanning at an accelerated voltage of 15 kV [30 (link)].
Jsm 6360lv scanning microscope
Manufactured by JEOL
Sourced in Japan
The JSM-6360LV is a Scanning Electron Microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging of samples. The JSM-6360LV uses an electron beam to scan the surface of a sample, generating detailed images that provide information about the sample's topography and composition.
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Lab products found in correlation
2 protocols using jsm 6360lv scanning microscope
1
Scanning Electron Microscopy of MTX-NPs
2
Scanning Electron Microscopy of PLGA Nanoparticles
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The images plain (F3) and coated (F3C) PLGA NPs was recorded by a scanning electron microscope (JSM-6360LV Scanning Microscope; Jeol, Tokyo, Japan). Suspended NPs were mixed for 5 min, and then a drop was smeared on a glass slide and kept in a desiccator to dry. The dried sample was mounted on a carbon tape and sputter-coated using a thin gold palladium layer under argon using a gold sputter module in a high-vacuum evaporator (JFC-1100 fine coat ion sputter; Jeol, Tokyo, Japan). The coated samples were then scanned and photographed (Fatma et al., 2016 (link)).
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