Scanning electron microscopy (SEM) was performed on a Jeol JSM 7500 F (Tokyo, Japan) equipped with an Oxford Instruments X-MAX 80 mm2 detector (Abingdon-on-Thames, UK). Solid state ultraviolet-visible (UV-Vis) spectroscopy was recorded via a Aglient Cary 500 Scan spectrophotometer equipped with an integrating sphere (Waldbronn, Germany). Photoluminescent emission spectra were recorded on a Jasco FP-8300 (Pfungstadt, Germany) instrument at ambient temperature with the excitation wavelength at 360 nm. Transmission electron microscopy (TEM) measurements were acquired using a double-corrected Jeol ARM200F (Tokyo, Japan), equipped with a cold field emission gun and a Gatan GIF Quantum. The used acceleration voltage was 200 kV and the emission was set to 10 μA in order to reduce beam damage. Sample was dispersed in dichloromethane and evaporated on active surface prior to TEM measurement. Combustive elemental analysis of CMp-vTA was recorded via a Vario Micro device (Langenselbold, Germany). Florescence of the droplets was excited by Vilber Lourmat brand Ultra-violet radiation (15 W) source with excitation wavelength of 365 nm (Marne-la-Vallee, France).
X max 80 mm2 detector
Manufactured by Oxford Instruments
Sourced in United Kingdom
The X-MAX 80 mm2 detector is a compact and high-performance energy-dispersive X-ray (EDX) detector designed for elemental analysis. It features a 80 mm2 active area and delivers excellent energy resolution for accurate identification and quantification of elements in a sample.
Automatically generated - may contain errors
Lab products found in correlation
Arm200f, by JEOL (1 mentions)
Fp 8300, by Jasco (1 mentions)
Gif quantum, by Ametek (1 mentions)
S 4800, by Hitachi (1 mentions)
Autosamdri 815, by Tousimis (1 mentions)
Confocal microscope, by Leica (1 mentions)
Jsm 7001f, by JEOL (1 mentions)
D2 phaser powder x ray diffractometer, by Bruker (1 mentions)
Avantage software, by Thermo Fisher Scientific (1 mentions)
6 protocols using x max 80 mm2 detector
1
Comprehensive Characterization of Carbon Materials
2
Scanning Electron Microscopy of Fibrillated Cellulose
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The
surface morphologies
of the unfibrillated (pH 2) and fibrillated (pH 12) fibers and smart
filters made thereof were studied using a field-emission scanning
electron microscope S-4800 (Hitachi, Japan). Prior to imaging, all
specimens were exchanged to ethanol and CO2 supercritical
dried (Autosamdri-815, Tousimis, USA) and sputter-coated for 20 s
with Pt/Pd (Cressington R208, UK).
X-ray energy dispersive spectroscopy
(EDS) analysis was carried out to determine the silica particle distribution
in the smart filters using scanning electron microscopy (SEM) at an
accelerating voltage of 7 kV equipped with an X-Max 80 mm2 detector (Oxford Instruments, UK).
surface morphologies
of the unfibrillated (pH 2) and fibrillated (pH 12) fibers and smart
filters made thereof were studied using a field-emission scanning
electron microscope S-4800 (Hitachi, Japan). Prior to imaging, all
specimens were exchanged to ethanol and CO2 supercritical
dried (Autosamdri-815, Tousimis, USA) and sputter-coated for 20 s
with Pt/Pd (Cressington R208, UK).
X-ray energy dispersive spectroscopy
(EDS) analysis was carried out to determine the silica particle distribution
in the smart filters using scanning electron microscopy (SEM) at an
accelerating voltage of 7 kV equipped with an X-Max 80 mm2 detector (Oxford Instruments, UK).
3
Scanning Electron Microscopy Imaging and EDX Analysis
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SEM measurement were performed on a Zeiss LEO 1550-Gemini system (acceleration voltage: 10 kV). An Oxford Instruments X-MAX 80 mm2 detector was used to collect the energy dispersive X-ray (EDX) data.
4
Characterization of Synthesized Electrodes
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To study the morphological and chemical properties of the produced electrodes, scanning electron microscopy (SEM) with an energy dispersive X-ray analysis (EDX) and Raman spectroscopy were used. The surface morphology was investigated by a SEM JEOL JSM-7001F (operating voltage 15 kV) with an EDX analyzer (Oxford Instruments XMax 80 mm2 detector). Raman spectroscopy was performed using a Renishaw micro-Raman spectrometer equipped with a confocal microscope (Leica, Wetzlar, Germany). The samples were measured in a backscattering geometry with a spectral resolution better than 1.0 cm−1. The incident light was not polarized and also the light detector contained no polarization filters. The Raman scattering spectra were excited by a 633 nm laser. The beam was focused on the samples with a 50× microscope objective with a numerical aperture of 0.4.
5
Characterization of Saturated CCM
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The saturated CCM after trial #1 was further characterised with different instrumental techniques. For CCM morphology and surface elemental characteristics analysis we employed a JEOL JSM-7800-F Field Emission Scanning Electron Microscope (FE-SEM) using an accelerating voltage of 20 kV and an approximate beam current of 1 nA. Energy dispersive X-ray spectroscopy (EDX) microanalysis utilised an Oxford Instruments X-max 80 mm 2 detector. X-ray powder diffraction (XRD) data were collected using a Bruker D2 Phaser X-ray powder diffractometer in reflection geometry with Cu Kα radiation (1.5418 Å) over the two-theta range 6-60 • for a total collection time of 10 min. Xray photoelectron spectroscopy (XPS) was performed on a Thermo K Alpha using an Al Kα mono-chromated (1486.6 eV) source with an overall energy resolution of ≈350 meV. The analysis area captured was approximately 400 µm x 600 µm, focused on the centre of the sample area to check for elements present. Data were processed using the Thermo Scientific Avantage software. In all quantifications, Scofield relative sensitivity factors (RSF) were used and peaks were fitted using Shirley background and Gaussian 70%/Lorentzian 30% peak shapes.
6
SEM Imaging of Au/Pd Sputtered Samples
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SEM imaging
was performed after Au/Pd sputtering of the sample on carbon sample
holders in a Zeiss LEO 1550-Gemini system (acceleration voltage: 3–10
kV) equipped with an Oxford Instruments X-MAX 80 mm2 detector,
which was used to collect the SEM-EDX data.
was performed after Au/Pd sputtering of the sample on carbon sample
holders in a Zeiss LEO 1550-Gemini system (acceleration voltage: 3–10
kV) equipped with an Oxford Instruments X-MAX 80 mm2 detector,
which was used to collect the SEM-EDX data.
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