Ft ir spectrum bx device

The uncorrected melting points of the synthesized compounds were measured using a Gallenkamp melting point device. A Perkin Elmer FT-IR Spectrum BX device was used to record the infrared (IR) spectra (as KBr disks). The nuclear magnetic resonance (NMR) spectra of the synthesized compounds were measured after dissolving the test samples in DMSO-d₆ and he measurements were achieved at 500 MHz for ₁H and 125.76 MHz for ₁₃C on Bruker NMR spectrometer at the Research Center, College of Pharmacy, King Saud University, Saudi Arabia. Chemical shifts are articulated in δ-values (ppm) compared to tetramethylsilane as an internal standard. Elemental analyses of the target compounds were executed at the Microanalysis Laboratory, Cairo University, Cairo, Egypt, and the results agreed favorably with the proposed structure within ±0.4% of the theoretical values (Table S1). Agilent Quadrupole 6120 LC/MS was utilized to record the mass spectra of the synthesized compounds with the aid of electrospray ionization (ESI) source. Silica gel thin layer chromatography plates with fluorescent indicator at 254 nm were acquired from Merck and visualization was accomplished by illumination with a UV light source (254 nm).