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Fesem 6700f electron microscope

Manufactured by JEOL

The FESEM 6700F is a field emission scanning electron microscope (FESEM) manufactured by JEOL. It is designed to provide high-resolution imaging of samples at the nanometer scale. The FESEM 6700F utilizes a field emission electron source to generate a focused electron beam that scans the surface of the sample, allowing for the acquisition of detailed information about the sample's topography and composition.

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4 protocols using fesem 6700f electron microscope

1

Self-Healing Hydrogel Characterization

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The prepolymer CN-Patch was added into a single-channel, then was extruded (Diameter: 29 G). The cylindrical hydrogel which was dyed into different colors was cut into two pieces. Then it was pieced together under certain pressure. After 3 minutes, the self-healing ability of the hydrogel was observed.
The microstructure of GNs, GNs-4-MAP, CCOD, CN-Patch, and bacteria was lyophilized and a layer of 2 nm thick Au was sputtered on the surface of the sample to increase its conductivity. The microstructure was observed by the JEOL FESEM 6700 F electron microscope, and the energy of primary electron was 3 kV.
The cylindrical hydrogel was prepared with a 30 mm diameter and 4 mm height. In all the experiments, the parallel plate geometry diameter (25 mm), temperature (25 °C), frequency (0.1 Hz), and oscillatory stress (1 Pa) were kept constant. The self-healing property of the hydrogel was tested by the rheological test in continuous step strain measurements (a fixed frequency of 10 rad s−1. Each strain interval was kept as 150 s.).
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2

Self-Healing Hydrogel Characterization

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The CCOD–Tra mixture was injected using a single-channel needle (diameter: 29 G), CHI-C–Tra and ODex were mixed for approximately 10 s, and then the hydrogel prepolymer was added to the syringe channel and extruded.
The cylindrical hydrogel was cut into two pieces and dyed with different colors. Then, it was pieced together under certain pressure. After 5 minutes, the self-healing ability of the hydrogel was observed.
The microstructure of CCOD and CCOD-BP was lyophilized, and a layer 2 nm thick was sputtered on the surface of the sample to increase its conductivity. The microstructure of the hydrogels was observed under a JEOL FESEM 6700F electron microscope, and the energy of the primary electron was 3 kV.
Similar to the previous test scheme, the cylindrical hydrogel was prepared with a 30 mm diameter and 4 mm height. In all the experiments, the parallel plate geometry diameter was 25 mm, and the temperature of 25 °C, frequency of 0.1 Hz, and oscillatory stress of 1 Pa were kept constant. The self-healing ability of the hydrogel was tested by the rheological test in continuous step strain measurements at a fixed frequency of 10 rad s−1. Each strain interval was kept as 150 s.
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3

Characterizing Quantum Dot Optical Properties

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UV-visible absorption spectra were measured using a Lambda 800 UV-vis spectrophotometer. Photoluminescent (PL) spectroscopy was measured with a Shimadzu RF-5301 PC spectrophotometer. Dynamic light scattering (DLS) and zeta potential measurements were performed using a Zetasizer NanoZS (Malvern Instruments). The excitation wavelength was 400 nm. PL quantum yields (PLQYs) of QDs were calculated at room temperature using quinine in 0.5 mol L−1 H2SO4 aqueous solution as the reference. Transmission electron microscopy (TEM) was performed using a Hitachi H-800 electron microscope at an acceleration voltage of 200 kV with a CCD camera. High-resolution TEM (HRTEM) imaging was performed by a JEM-2100F electron microscope at 200 kV. A scanning electron microscope (SEM) image was implemented with a JEOL FESEM 6700F electron microscope with primary electron energy of 3 kV. X-ray powder diffraction (XRD) investigation was taken using a Siemens D5005 diffractometer. Inductive coupled plasma emission spectrometry (ICP) was performed with a PerkinElmer Optima 3300DV analyser. Luminous efficacy, CIE (Commission Internationale de L'Eclairage 1931), color temperature, and other properties of devices were taken using HAAS2000. The color of light was identified by the CIE colorimetry system. Any color could be described by the chromaticity (x, y) coordinates on the CIE diagram.
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4

Materials Characterization Techniques Protocol

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Scanning electron microscopy (SEM) images were collected on a JEOL JSM-6700F field emission scanning electron microscope. X-ray energy-dispersive spectroscopy (EDX) analysis was acquired on a JEOL FESEM 6700F electron microscope. X-ray photoelectron spectroscopic (XPS) analysis was performed on a VG Escalab MK-II spectrometer with an Al Kα (1486.5 eV) achromatic X-ray source. X-ray diffraction (XRD) pattern was collected on a Rigaku X-ray diffractometer (D/max rA, using CuKα radiation at 1.542 Å). UV-Vis absorption spectra were obtained using a Varian Cary 50 UV-Vis spectrometer.
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