The FAA-fixed samples were dehydrated by passing through increasing concentrations of ethanol in water (70%, 80%, 90%, and 100%). The samples were then dried in a Balzers CPD 030 critical point dryer (BAL-TEC AG, Balzers, Liechtenstein) supplied with liquid CO2 and then coated with gold using a Quorum (model SC7620) sputter coater. Photomicrographs were recorded using a Mira 3 field-emission scanning electron microscope (Tescan, Brno-Kohoutovice, Czech Republic).
Mira3 field emission scanning electron microscope
Manufactured by TESCAN
Sourced in Czechia
The MIRA3 is a field emission scanning electron microscope (FE-SEM) manufactured by TESCAN. It provides high-resolution imaging and accurate analysis of a wide range of samples. The MIRA3 utilizes a field emission gun to generate a stable and high-brightness electron beam, enabling the capture of detailed, high-quality images at low accelerating voltages.
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Lab products found in correlation
Alpha ftir, by Bruker (1 mentions)
Xplora plus raman spectrometer, by Horiba (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
V 750 spectrometer, by Jasco (1 mentions)
Ims 1280 ion microprobe, by Cameca (1 mentions)
Vertex 70, by Bruker (1 mentions)
Pw1730, by Philips (1 mentions)
6100 series quadrupole lc ms system, by Agilent Technologies (1 mentions)
Avaspec 2048 tec, by Avantes (1 mentions)
5 protocols using mira3 field emission scanning electron microscope
1
Scanning Electron Microscopy Sample Preparation
2
Scanning Electron Microscopy of Stomatocysts
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To record stomatocyst morphology, 100–200 stomatocysts per strain were mounted on 0.45 μm nylon membrane filters using single-cell isolation. The filters were mounted onto aluminum stubs with double-sided tape. The stubs were coated with platinum and viewed with a MIRA3 field emission scanning electron microscope (TESCAN Ltd., Brno, Czech Republic) at 10 kV.
3
Comprehensive Material Characterization Protocol
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The transmittance spectra of studied materials were characterized using Fourier transform infrared (FTIR) spectroscopy on a Bruker Alpha FTIR with an attenuated total reflection (ATR) attachment in the 600–4000 cm−1 range. The absorption spectra of the samples were measured using a Jasco V-750 spectrometer in the 190–900 nm range. Raman spectroscopy was studied on a XploRA PLUS Raman spectrometer (Horiba, France) with a 50 × objective. X-ray diffraction (XRD) patterns were investigated using a Bruker D8 Advance Diffractometer with a CuKα radiation source (λ = 1.5418 Å). Morphological characterization was carried out using a Park XE-7 atomic force microscope (AFM) and a TESCAN MIRA3 field emission scanning electron microscope (SEM). AFM image analysis was carried out in XEI software (1.8.0 version) provided by PARK Systems, Korea. Elemental analysis was carried out by energy dispersive spectroscopy (EDS). Electrical characterizations (I–V) and chemiresistive sensing experiments were measured with a Keithley 4200A semiconductor analyzer at room temperature (22 °C) in an indigenously designed and fabricated dynamic gas sensing system.
4
Zircon Analysis of NWA Martian Meteorites
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Three rock chips of NWA 7034, NWA 11522, and NWA 11220 were mounted in epoxy and polished (Fig. 1 ). For additional details on samples and methods, see text S1. The samples were analyzed using a TESCAN MIRA3 field emission scanning electron microscope at Curtin University to collect BSE and phase maps of the rock chips. A total of 66 zircon grains [NWA 7034 (n = 26), NWA 11522 (n = 7), and NWA 11220 (n = 33)] were surveyed using BSE and CL imaging and analyzed for orientation with EBSD mapping at Curtin University. Zircon grains were mapped by EBSD at step sizes from 40 to 100 nm. The U/Pb analysis of the shock-twinned zircon grain was performed using a CAMECA IMS 1280 ion microprobe at the University of Western Australia (text S1 and table S6).
5
Comprehensive Characterization of Novel Materials
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X-ray diffraction (XRD) of the specimens was conducted using a X-ray diffractometer (Philips, PW1730, Netherland), with Cu Kα radiation (λ = 0.15406 nm) in the range of 2θ = 5°–80°, with a step size of 0.05° for confirming and analyzing the phase structure. Ultraviolet (UV)-vis diffuse reflectance spectra were acquired using a UV–vis spectrometer (Avantes, AvaSpec-2048-TEC, Netherland) along with a 150 mm integrating sphere. Fourier transform infrared (FTIR) spectroscopic analysis of the prepared materials was performed on a FTIR instrument (Bruker, VERTEX70, Germany). The specific surface areas of the samples were measured by N2 adsorption desorption isotherms at 77 K, using a adsorption apparatus (Bel, Belsorp-mini II, Japan) based on Brunauer-Emmett-Teller theory. Mean pore diameter and pore volume were determined by the N2 adsorption volume at a relative pressure of 0.99, using a Barrett-Joyner-Halenda (BJH) technique. The morphology of the materials was analyzed by a MIRA3 field emission scanning electron microscope (TESCAN, Mira 3, Czech Republic) operating at 15.0 kV. The dispersion of the samples was performed using Ultrasonic homogenizer apparatus (FAPAN, 400UT, Iran). The intermediates and by-products reactions were evaluated using the Agilent 6100 Series Quadrupole LC/MS system.
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