Jem 2000fx microscope

The ex situ TEM observation of Sn@SiO₂ was carried out using a conventional TEM (JEM-2000FX microscope, JEOL) operated at 200 kV and a high-resolution field-emission gun scanning TEM (STEM, JEM-ARM200F Cold, JEOL) operated at 200 kV at room temperature and under a pressure of 10⁻⁶ Pa.

The prepared solutions were analyzed with a UV-vis spectrophotometer (UNICAM UV-vis Spectrophotometer UV4). The size and morphology of the nanoparticles were studied using TEM (JEOL model JEM-2000FX microscope operated at an accelerating voltage of 200 kV, JEOL, Tokyo, Japan). The image analysis ImageJ 1.54g software was used for the analysis of the AgNP size distribution. XRD analysis was used to demonstrate the silver in the nanoparticles.
The infrared spectra were recorded with a Bruker Tensor 27 FTIR spectrometer (Bruker, Billerica, MA, USA) equipped with a DTGS KBr detector. For each sample, 64 scans were measured in the 4000–400 cm⁻¹ spectral range in abs mode with a resolution of 4 cm⁻¹. The KBr pressed-disc technique was used to prepare a solid sample for routine spectra scanning. Samples of approximately 0.1 mg were dispersed in 150 mg of KBr to record optimal spectra in the regions of 4000–400 cm⁻¹. The diameter of the pellets pressed from the samples was 13 mm.

Prepared solutions were analyzed by UV-vis Spectrometer (UNICAM UV-vis Spectrophotometer UV4) on the day 0 (three hours after the preparing) and on the 7th day. The size and morphology of the nanoparticles were studied by means of TEM (JEOL model JEM-2000FX microscope operated at an accelerating voltage of 200 kV). The image analysis (ImageJ software, National Institutes of Health and the Laboratory for Optical and Computational Instrumentation (LOCI, University of Wisconsin LicensePublic Domain, BSD-2 Version 1.53t)) was used for the analysis of Ag nanoparticles’ size distribution.