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12 protocols using ht7700

1

Nanostructural Characterization of SiNPs-Ag

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The nanostructure and composition of SiNPs-Ag were characterized by TEM using a JEOL HT-7700, with a setting voltage of 120 kV. The energy-dispersive X-ray spectroscopy (EDS) integrated in the HT-7700 microscope was used for elemental mapping of the particles under scanning transmission electron microscopy (STEM) mode. Nitrogen adsorption–desorption analysis was carried out by using Micrometrics Tristar 3020II. Before analysis, samples were first degassed overnight under vacuum at 150 °C. The zeta potential of nanoparticles in phosphate-buffered saline (1× PBS, pH = 7.4) was measured by a Zetasizer Nano (Malvern, Worcestershire, UK).
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2

Comprehensive Material Characterization

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The morphologies of samples were examined by transmission electron microscopy (TEM, HT7700), and high-resolution transmission electron microscopy (HRTEM, JEOL JEM-2001F). The chemical environments of samples were measured by X-ray photoelectron spectroscopy (XPS) (Escalab 250Xi) with Al Kα radiation. Raman spectra of samples were tested with a LabRAM HR Evolution. The N2 adsorption-desorption curves of samples were measured by Brunauer-Emmett-Teller (BET) (ASIC-2). The metal content in catalysts was investigated by ICP-MS (Vista Axial).
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3

Comprehensive Material Characterization Protocol

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Morphologies of the as-prepared samples were obtained on a field emission scanning electron microscopy (FESEM) (Hitachi SU-8010), transmission electron microscopy (TEM) (HT7700), and high-resolution transmission electron microscopy (HR-TEM) (JEOL JEM-2001F). The crystal structures of the as-prepared samples were analyzed by X-ray powder diffraction (XRD) (Empyrean 200,895) using Cu Kα radiation. Chemical structures of the as-prepared samples were measured by X-ray photoelectron spectroscopy (XPS, Escalab250Xi) with Al Kα radiation. Raman spectra were obtained by a LabRAM HR Evolution unit. The metal content in samples was analyzed by inductively coupled plasma mass spectrometry (ICP-MS) (Vista Axial). The X-ray absorption spectroscopic (XAS) measurements of the as-prepared samples were conducted in Beijing Synchrotron Radiation Facility and Taiwan Synchrotron Radiation Facility. Quantum Design MPMS-7 superconducting quantum interference device (MPMS-VSM) magnetometer was utilized to obtain the magnetic properties of the as-prepared catalysts. The electron paramagnetic resonance (EPR) data of the as-prepared catalysts were acquired on a Bruker EMXmicro.
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4

Multimodal Characterization of Nanomaterials

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Zeta-potential and dynamic light scattering (DLS) measurements were tested using Zetasizer Nano series (Malvern ZEN3700,UK); SEM images were obtained by the scanning electron microscope (HITACHI S-4800, HITACHI, JAPAN); TEM images were gotten by the transmission electron microscope (HT7700, JEOL, JAPAN); Energy-dispersive spectroscopy was performed by JEM-2100 F transmission scanning electron microscope (JEM-2100 F, JEOL, JAPAN); X-ray diffraction pattern (PXRD) was obtained using the X-ray diffractometer (Bruker, D8 focus, Germany); DCF fluorescence was acquired by fluorescence spectrometer (Cary Eclipse, Shanghai, China); the surface functional group was measured by 3100 Fourier transform infrared spectrometer (FT-IR, Varian, USA); elastic modulus was tested using atomic force microscope (Bruker, Dimension FastscanBio, USA); enzyme standard instrument was used to the absorbance (EPOCH2, BioTek, Germany); the hyperspectral images were from Hyperspectral imager (Cytoviva, USA); fluorescence images of cell were obtained by Inverted fluorescent microscope (Nikon ECLIPSE Ti-S, Japan).
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5

Characterization of Synthesized GNPs

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After synthesis by PLIs, the optical properties of GNPs were monitored using a spectrophotometer (JASCO V-570). TEM images of GNPs were recorded using two TEM devices, a Hitachi HT7700 and a JEOL JEM-2100F with accelerating voltages of 100 kV and 200 kV, respectively.
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6

Characterization of Nanocrystal Samples

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TEM images are acquired on a
Hitachi HT7700 and on a JEOL JEM-1400 Plus, both operating at 100
keV. High-resolution TEM and STEM/EDX images are taken on a FEI Talos
operating at 200 keV. For better STEM/EDX imaging, TEM samples are
submerged in ethanol after drop-casting the nanocrystal solutions
on TEM grids. Size distributions are evaluated by measuring >100
particles
per sample with ImageJ software. Absorption spectra are measured with
an Agilent Cary 5000 UV–Vis–NIR spectrophotometer by
measuring diluted nanocrystals in tetrachloroethylene. For absorption
coefficient determination, a thin film of nanocrystals with known
thickness is spin-coated on a glass substrate and transmission and
reflection is determined. Fourier transform infrared spectroscopy
(FTIR) measurements are performed on a Bruker Vertex 70 spectrometer
at room temperature by drop casting nanocrystal solutions on ZnSe
windows. Absorption spectra from different measurements are joined
together by matching overlapping energy ranges. Energy-dispersive
X-ray spectroscopy (EDX) data are measured with FEI Quanta 200 FEG
SEM microscopes, operating at 30 keV. X-ray diffraction (XRD) measurements
are carried out on a Rigaku SmartLab 9 kW System with a rotating Cu
anode and a HyPix-3000SL 2D solid-state detector. Rietveld refinement
is performed with FullProf Suite software.
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7

Tissue Preparation for Electron Microscopy

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Anesthetized mice were fixed by intracardial perfusion with 2% glutaraldehyde and 2% paraformaldehyde in 0.1 M phosphate buffer, pH 7.4. Slices of thus fixed tissues were postfixed with 2% OsO4, dehydrated in ethanol and embedded in Epok 812 (Okenshoji Co.). Ultrathin sections were cut with a ultramicrotome (ultracut N or UC6: Leica), stained with uranyl acetate and lead citrate, and were examined on a Hitachi HT7700 or JEOL JEM-1230 electron microscope.
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8

Structural and Morphological Analysis of Samples

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The morphology and structure of the sample was investigated by transmission electron microscopy (TEM, Hitachi HT 7700) and high-resolution TEM (HRTEM, JEOL-2010). X-ray diffraction patterns were obtained using a Bruker D8 Advance with Cu-Kα radiation. X-ray photoelectron spectra (XPS) of the samples were recorded on an ESCALAB 250. The thermogravimetric analysis (TGA) was carried out on SDT 2960 with a heating rate of 10 °C min−1 from 20 to 600 °C. The BET surface area was determined on an ASAP 2460 sorption apparatus. All the as-prepared samples were degassed at 150 °C for 10 h prior to nitrogen adsorption measurements. Electron paramagnetic resonance (EPR) tests were carried out on a Bruker A300 spectrometer (X-band, frequency 9.43 GHz) equipped with Bruker ER4141VTM liquid nitrogen system. The microwave power was 0.595 mW and modulation amplitude 3.0 G. The samples were measured at 90 K with center field 3500 G and sweep width 5000 G.
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9

Advanced Characterization of Aerogel Materials

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X-ray diffraction (XRD) determination was performed on a Rigaku Dmax-rc X-ray diffractometer in the angular range of 2θ = 10°–80°. The scanning electron microscope (SEM) (Hitachi SU8010, Tokyo, Japan) image was taken on JEOLLTD JSM-6700F, while the transmission electron microscope (TEM) (JEOL JEM, 1011, Tokyo, Japan) that was used was the HT-7700. Fourier transform infrared (FT-IR) spectra were recorded on the ATR-FTIR spectrometer (Thermo Fisher, Nicolet iS5, Waltham, MA, USA) in the 650–4000 cm−1 region. The compression performance of the aerogel was measured by a texture analyzer (TA, TMS-PRO, FTC, USA). The surface area was identified by the N2 adsorption–desorption isotherms at 77 K based on the BET model (Micromeritics, USA). X-ray photoelectron spectroscopy (XPS, Thermo Fisher, Thermon ESCALAB 250XI spectrometer, USA) were recorded to characterize the elemental states.
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10

Comprehensive Materials Characterization Methodology

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The crystalline phase of each sample was determined via X-ray diffraction (XRD; D5000, Siemens), using copper Kα radiation (λ = 1.5418 Å) at a scan rate of 0.02° s−1. The morphology of each film was examined using field emission scanning electron microscopy (Hitachi, SU 8000), transmission electron microscopy TEM (Hitachi, HT-7700), and high-resolution TEM (JEOL JEM-2100 F). The optical absorption properties in the spectral region of 190–900 nm were assessed using a Thermo Scientific Evolution 300 UV–vis spectrophotometer. The photoluminescence and Raman spectra were collected using a Renishaw inVia 2000 system with an argon ion laser emitting at 325 and 532 nm, respectively. X-ray photoelectron spectroscopy (XPS) measurements were performed using synchrotron radiation from beamline no. 3.2 at the Synchrotron Light Research Institute, Thailand.
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