Powder X-ray diffraction (PXRD) experiments were performed on a Bruker D8 Advanced X-ray diffractometer at room temperature using Cu Kα radiation (λ = 1.5406 Å) at a scan speed of 0.5 ° min–1 and a step size of 0.01° in 2θ.
D8 advanced x
Manufactured by Bruker
The D8 Advanced X-ray Diffractometer is a versatile laboratory instrument designed for advanced X-ray diffraction analysis. It provides accurate and reliable measurements of crystalline materials.
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2 protocols using d8 advanced x
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Powder X-ray Diffraction Characterization
2
Characterization of Material Properties
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X-ray diffraction patterns were performed using a Bruker D8 Advanced X-ray diffractometer with Cu Kα radiation at room temperature. The composition of samples was determined by an energy-dispersive X-ray (EDX) spectrometer affiliated to a Zeiss field emission scanning electron microscope (SEM). The transport measurements were done by a standard four-terminal method in Quantum Design PPMS-Dynacool equipped with 14T magnet. Ohmic contacts were obtained by evaporating gold pad to samples before attaching wires with silver paste.
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