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4 protocols using photon 100 detector

1

Single Crystal X-Ray Diffraction Analysis

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Single crystal X-ray diffraction data were collected for NiL7 at beamline 11.3.1 at the Advanced Light Source (λ = 0.7749 Å), USA using a Bruker D8 diffractometer with PHOTON100 detector. The crystal was held at 150 K in an Oxford Cryosystems Cryostream Plus. Data were processed using Bruker APEX2 and SAINT68 software and corrected for the effects of absorption by SADABS.69 Single crystal X-ray diffraction data for all other structures were collected using a Stoe IPDS2 diffractometer with monochromated Mo Kα radiation (λ = 0.71073 Å). Crystals were held at 150 K in an Oxford Cryosystems Cryostream. Data were processed using Stoe X-AREA suit of programs. For FeL3 and CuL10 a multi-scan absorption correction was carried out within Sortav.70 (link) Crystal structures were solved using SHELXT (ref 3) and refined against all unique F2 values using SHELXL.71 Hydrogen atoms were added at geometrically calculated positions except in the case of those attached to nitrogen or oxygen, for which atom positions were refined subject to chemically-sensible restraints.
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2

Structural Elucidation of Compounds

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1H- (400, 500, and 600 MHz), and 13C-NMR (100, 125, and 150 MHz) and 2D-NMR spectra were recorded on Bruker Avance-NMR spectrometers (France) in CD3OD, CD3COCD3 or DMSO-d6. Melting points were recorded on Buchi M-560 apparatus (Japan). EI- and HREI-MS were recorded on JEOL JMS-600H (Japan). Optical rotations of all isolated compounds were measured on JASCO P-2000 polarimeter (Japan) in chloroform or methanol. IR analyses were performed on Bruker Vector 22 FT-IR spectrometer (France). Evolution 300 UV-visible spectrophotometer was used to record the UV spectra (Thermo Scientific, England). Single-crystal X-ray diffraction data was collected on Bruker APEXII D8 Venture diffractometer, fitted with PHOTON 100 detector (CMOS technology), and fine-focus sealed tube having X-ray source [Cu Kα radiation α = 1.54178 Å]. Reflection intensities were integrated using SAINT software. Absorption correction was done on M-multi-scan. Structures were solved on SHELXTL [30 –31 ].
Crystallographic data for compounds 1, 2, 4, and 8 were deposited with the Cambridge Crystallographic Data Center and can be obtained free of charge from the Cambridge Crystallographic Data Center viawww.ccdc.cam.ac.uk/data_request/cif.
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3

Structural Analysis of Organophosphorus Compounds

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The samples were studied with monochromatized Mo-Kα radiation (λ = 0.71073 Å). The X-ray diffraction data of the compounds S,RP-1b, S,SP-1d and S,SP-9b were collected at T = 150(2) K by using a D8 VENTURE Bruker AXS diffractometer equipped with a (CMOS) PHOTON 100 detector. The X-ray diffraction data of the compounds FcSOFc and S,SP-7 were collected at T = 150(2) K by using an APEXII Kappa-CCD (Bruker-AXS) diffractometer equipped with a CCD plate detector and a CCD-LDI-APEX2 detector, respectively. The crystal structures were solved by the dual-space algorithm using SHELXT program [94 (link)] and then refined with full-matrix least-squares methods based on F2 (SHELXL program) [95 (link)]. All non-hydrogen atoms were refined with anisotropic atomic displacement parameters. H atoms were finally included in their calculated positions and treated as riding on their parent atom with constrained thermal parameters. The molecular diagrams were generated by Mercury 2020.3.0.
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4

Spectroscopic Characterization of Compounds

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NMR spectra were recorded on a Bruker Avance III-400 instrument (Bruker, Karlsruhe, Germany) . ESI-MS data were obtained via ultra-performance liquid chromatography with an Acquity UPLC system, coupled to a Waters Synapt G2 quadrupole time-of-flight (QTOF) mass spectrometer using an electrospray ionization technique operating in positive mode (Milford, Massachusetts, USA). IR spectra were recorded by a Perkin Elmer spectrum 100 FT-IR spectrophotometer (Waltham, Massachusetts, USA). Optical rotations were recorded on a Perkin Elmer Model 341 polarimeter. Single crystal X-ray data were collected using a Bruker D8 Venture diffractometer using monochromated CµKα (k = 1.54178 Å), a Photon 100 detector (Billerica, Massachusetts, USA), and APEX III control software (Bruker AXS Inc.) . Data reduction was performed using SAINT+ (Bruker AXS Inc.) , and the intensities were corrected for absorption using SADABS (Bruker AXS Inc.) . All structures were solved by direct methods using a SHELXS algorithm (Sheldrick, 2015a) and refined using the SHELXL program (Sheldrick, 2015b) . All H atoms were placed in geometrically idealised positions and constrained to ride on their parent atoms. The X-ray crystallographic coordinates for all structures have been deposited at the
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