Avance av 3 nmr spectrometer

XRD spectra was collected by Philips X’Pert Pro Super diffractometer with Cu-Kα radiation (λ = 1.54178 Å). The HAADF-STEM measurement was carried out on a JEOL JEM-ARF200F. The ESR measurements were recorded on a JES-FA200 model spectrometer operating at the X-band frequency. AFM was measured on the Veeco DI Nano-scope MultiMode V system. The X-ray photoelectron spectra (XPS) were detected on an ESCALAB MKII with Mg Kα as the excitation source, using C 1s (284.6 eV) as a reference. The Fourier-transform infrared (FT-IR) spectra were collected on a MAGNA-IR 750 (Nicolet Instrument Co, U.S.). Room temperature PL spectra were carried out by using a Jobin Yvon Fluorolog 32TAU luminescence spectrometer (Jobin Yvon Instruments Co., Ltd., France). The valence band XPS spectra were detected at beamline BL10B in the National Synchrotron Radiation Laboratory (NSRL), Hefei, China. The NMR experiments were carried out on with a 400-MHz Bruker AVANCE AV III NMR spectrometer. The electrochemical measurements were performed an electrochemical workstation (CHI760E, Shanghai Chenhua Limited, China). Isotope Tracing Experiments: The isotope tracing experiments were performed using ¹³CO₂ (99%, Cambridge Isotope Laboratories, Inc.) and the corresponding products were measured by determined via the ¹³C-coupled satellites in a 400-MHz Bruker AVANCE AV III NMR spectrometer.