Lsm 700 3d laser scanning microscope

Manufactured by Zeiss

Sourced in Germany

The LSM 700 is a 3D laser scanning microscope manufactured by Zeiss. It enables high-resolution imaging and analysis of samples by scanning them with a laser beam and capturing the reflected light. The device provides detailed 3D reconstructions of the scanned samples.

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Lab products found in correlation

Tecnai 12 transmission electron microscope, by Philips (2 mentions) Invia raman spectrometer, by Renishaw (2 mentions) Cary 5000 spectrophotometer, by Agilent Technologies (2 mentions) S 4800 2 field emission scanning electron microscope, by Hitachi (2 mentions) Tecnai g2 f30 s twin, by Thermo Fisher Scientific (1 mentions) X ray powder diffractometer, by Bruker (1 mentions) Tecnai g2 f30 stwin field emission transmission electron microscope, by Thermo Fisher Scientific (1 mentions) Cary 610 670 micro infrared spectrometer, by Agilent Technologies (1 mentions)

Spelling variants of this product

LSM 700 (4063 citations) LSM 700 microscope (336 citations) LSM 700 Laser Scanning Microscope (99 citations) Laser scanning microscope (67 citations) LSM 700 laser (25 citations) Laser Scanning Microscope 700 (19 citations) LSM 700 laser scanning (9 citations)

2 protocols using lsm 700 3d laser scanning microscope

Comprehensive Characterization of Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols

XRD analysis was
performed by Powder X-ray diffraction (Bruker AXS, German). The SEM
images were obtained by an S-4800 II Field emission scanning electron
microscope (Hitachi, Japan). The TEM images were obtained by a Tecnai
12 transmission electron microscope (Philips, Netherlands). The Raman
spectra were recorded by an InVia Raman spectrometer (Renishaw, Britain).
The UV–vis spectra were recorded on a Cary 5000 spectrophotometer
(Varian). HRTEM images were obtained by a Tecnai G2 F30 S-TWIN field
emission transmission electron microscope (FEI). The AFM images were
obtained on a nanoscope (Digital Instruments). The wear scar micrographs
were recorded by an LSM 700 3D Laser Scanning Microscope (CARL ZEISS,
German).

Wu P.R., Liu Z, & Cheng Z.L. (2019). Ultrasound-Assisted Alkaline Solution Reflux for As-Exfoliated MoS2 Nanosheets. ACS Omega, 4(6), 9823-9827.

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Multimodal Characterization of Novel Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols

XRD patterns, Raman, UV-vis and FTIR spectra were inspected by powder X-ray diffractometer (Bruker AXS, German), inVia Raman spectrometer (Renishaw, Britain), Cary 5000 spectrophotometer (Varian, USA) and Cary 610/670 micro infrared spectrometer (Varian, USA), respectively. The SEM, TEM and HRTEM images were recorded by a S-4800II field-emission scanning electron microscope (Hitachi, Japan), a Tecnai 12 transmission electron microscope (Philips, Netherlands) and a Tecnai G2 F30 S-TWIN field-emission transmission electron microscope (FEI, USA), respectively. The AFM analysis was conducted on a Nanoscope (Digital Instruments, USA). The wear scar micrographs were obtained using a LSM 700 3D laser scanning microscope (CARL ZEISS, Germany).

Wu P.R., Liu Z, & Cheng Z.L. (2019). Hydrothermal-assisted shearing exfoliation for few-layered MoS2 nanosheets. RSC Advances, 9(30), 17016-17024.

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