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7600f sem

Manufactured by JEOL
Sourced in Japan

The JEOL 7600F is a high-performance scanning electron microscope (SEM) designed for advanced imaging and analysis applications. It features a field emission electron gun and a range of detectors, providing high-resolution imaging and analytical capabilities.

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3 protocols using 7600f sem

1

Exosome Ultrastructure Analysis by SEM

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Exosomes suspended in 100 µl PBS were fixed with 2.5% glutaraldehyde dissolved in 0.1 M cacodylate solution (pH 7.0) for 2 hr followed by 2% osmium tetroxide for one hr. Diluted samples were added to cleaned silicon chips and treated with acetone, ethanol and distilled water. Immobilized and dried silicon chips were imaged by JEOL-7600F SEM.
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2

Fracture Toughness Evaluation of Materials

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The toughness of the samples, in terms of the critical stress intensity factor (KIc) and the critical strain energy release rate (GIc) at fracture initiation, were determined by a single-edge-notch bending (SENB) geometry according to the ASTM D5045 standard test method. Specimens were cut to 88 mm × 20 mm × 10 mm, including a sharp notch by machining. Subsequently, a natural crack was obtained by tapping a fresh razor blade on the notch. Samples were loaded in bending using a Zwick Universal testing machine (Ulm, Germany) equipped with a 50 kN load cell, at 1 mm/min crosshead displacement speed. The load and displacement were recorded. The fracture toughness of 5 specimens for each composition was estimated using the corrected modified beam theory. Moreover, the failure surfaces of the specimens were examined after SENB tests by scanning electron microscopy (SEM) using a Jeol 7600F SEM (JEOL, Ltd., Tokyo, Japan). The sample surfaces were coated with a thin layer (8 nm) of chromium by sputtering in a Cressington 280HR chamber (Watford, UK).
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3

Characterization of MoS2 Crystals from Norway

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MoS 2 crystals were obtained from the Sçrumsaasen mine, Spikkestad, Drammen, Norway.
N,N-dimethylformamide, (DMF) and potassium sulfate were purchased from Sigma-Aldrich, Singapore. Glassy carbon (GC) with a diameter of 3 mm was obtained from CH Instruments, USA. Scanning Transmission Electron Microscopy (STEM) images were obtained by using Jeol 7600F SEM (Jeol, Japan) operating at 30 kV. X-ray photoelectron spectroscopy (XPS) was performed with a monochromatic Mg X-ray radiation source and a Phoibos 100 spectrometer (SPECS, Germany). Raman spectroscopy analysis was performed using a confocal micro-Raman LabRam HR instrument (Horiba Scientific, Japan) in backscattering geometry with a CCD detector, a 633 nm HeNe laser and a 100x objective mounted on a Olympus optical microscope.
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