7600f sem
The JEOL 7600F is a high-performance scanning electron microscope (SEM) designed for advanced imaging and analysis applications. It features a field emission electron gun and a range of detectors, providing high-resolution imaging and analytical capabilities.
3 protocols using 7600f sem
Exosome Ultrastructure Analysis by SEM
Fracture Toughness Evaluation of Materials
Characterization of MoS2 Crystals from Norway
N,N-dimethylformamide, (DMF) and potassium sulfate were purchased from Sigma-Aldrich, Singapore. Glassy carbon (GC) with a diameter of 3 mm was obtained from CH Instruments, USA. Scanning Transmission Electron Microscopy (STEM) images were obtained by using Jeol 7600F SEM (Jeol, Japan) operating at 30 kV. X-ray photoelectron spectroscopy (XPS) was performed with a monochromatic Mg X-ray radiation source and a Phoibos 100 spectrometer (SPECS, Germany). Raman spectroscopy analysis was performed using a confocal micro-Raman LabRam HR instrument (Horiba Scientific, Japan) in backscattering geometry with a CCD detector, a 633 nm HeNe laser and a 100x objective mounted on a Olympus optical microscope.
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