Jsm 6510
The JSM-6510 is a Scanning Electron Microscope (SEM) manufactured by JEOL. It is a versatile, high-performance instrument designed for a wide range of applications. The JSM-6510 provides high-quality imaging and analytical capabilities for various materials and samples.
Lab products found in correlation
170 protocols using jsm 6510
Echinoderm Spine Structure Analysis
3D Bioprinted cECM Hydrogel Scaffold Ultrastructure
The 3D scaffolds were fixed in 4% paraformaldehyde (PFA) in PBS for 48 h and then washed three times with 0.1 M phosphate buffer (PB). Next, the samples were incubated in 4% osmium tetroxide for 90 min and then rinsed with deionized water. Subsequently, samples were dehydrated by washing them with ethanol 80% (×2), 90% (×3), 96% (×3), and 100% (×3) and preserved in absolute ethanol at 4 °C until critical point drying (Autosamdri-815 critical point dryer, Tousimis, Rockville, MD, USA). Samples were then carbon coated and mounted using conductive adhesive tabs (TED PELLA, Redding, CA, USA). Imaging was performed by using an SEM (JSM-6510, JEOL, Tokyo, Japan) at 15 kV.
The diameter of the fibers was assessed following the method developed in [47 (link)]. Briefly, 10 fibers of three different zones of each sample were randomly selected, and their diameter was computed with ImageJ Software v1.53 (National Institute of Health, Bethesda, MD, USA).
Analyzing Plastic Surface Erosion After Microbial Degradation
Scanning Electron Microscopy of Samples
Wear Resistance of MAO Coatings
Microstructural Analysis of Produced Samples
SEM Analysis of Fracture Surfaces
Microscopic Analysis of Dental Restorations
The first cut was transversal on the occlusal face, followed by a sectional cut in the wall of the proximal restoration, and finally an internal longitudinal cut was made in the middle part of the restoration (
Characterization of Cement Materials by XRD and SEM
Structural Characterization of VM9 and PM9
For the SEM (Scanning Electron Microscopy) analyses (n=3) of VM9, PM9 and PM9 press pellet specimens, the specimens were polished and etched with 2% HF (hydrofluoric acid) for 15 s and sputter-coated with goldpalladium. The specimens were examined in a scanning electron microscope (JEOL -JSM 6510, Jeol, Tokyo, Japan), operating at 10 kV. Three scanning electron micrographs from each group were obtained at a magnification of 500×, 1000× and 2000×. The Image J software (National Institutes of Health, Bethesda, MD, USA) was used to analyze the crystalline phase concentration of VM9, PM9 press pellet and pressed PM9. The SEM images of 1000x magnification (n=9) were used to measure the crystalline area, three times per image. The mean of the measurements was used for statistical analysis.
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