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Mm007

Manufactured by Rigaku
Sourced in Japan

The MM007 is a high-performance X-ray diffractometer system designed for materials analysis. It features a robust and stable goniometer, a high-intensity X-ray source, and advanced data acquisition and analysis capabilities. The MM007 is capable of performing a wide range of X-ray diffraction experiments, including phase identification, structural analysis, and thin-film characterization.

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3 protocols using mm007

1

3D Structural Analysis of Bagworm Spinneret

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3D X-ray microscope CT observations of the spinneret were performed using a nano3DX (Rigaku Co., Japan). The spinneret, which had been dissected from a final instar of E. variegata bagworm larvae, was gently washed with distilled water and then dried overnight under room conditions (25 °C and 50% relative humidity). The dried sample was fixed in an upright position on the sample stage and primarily measured using Cr characteristic X-ray radiation (5.4 keV) produced from a high-brilliance X-ray generator (MM007; Rigaku Co., Japan) with 35 kV and 25 mA, which is suitable for visualising the fine structures of organs because of the appropriate X-ray absorption contrast. The field of view in the high-resolution 2D X-ray sCMOS image sensor camera (XSight Micron LC; Rigaku Innovative Technologies Europe s.r.o., Czech Republic) was 0.6 × 0.6 mm2 and the effective pixel size was set to 0.3 μm. The sample was rotated by 180°and 600 projection images were captured in 900 s. Using an FDK algorithm30 (link), 2000 X-ray tomograms with a thickness interval of 0.3 μm were reconstructed.
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2

X-ray Diffraction Measurements Protocol

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Measurements were carried out using a copper rotating anode MM007 with 0.8 kW as the goniometer head and R-AXIS IV++ as the image plate detector (Rigaku; Tokyo, Japan). The exposure time was 3 min at 24 °C.
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3

Single Crystal X-Ray Diffraction Analysis

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While single crystals of 6–8 for X-ray diffraction analysis were grown by slow diffusion of hexane into their CH2Cl2 solutions at −5 °C. A single crystal of 6–8 was mounted on a Rigaku MM-007 (rotating anode) diffractometer equipped with a Bruker P4 accessory. While the data of 6 and 8 were collected using a confocal monochromator with Mo Kα radiation (λ = 0.71073 Å) in the ω scanning mode at 113 K, data of 7 were collected using a confocal monochromator with Mo Kα radiation (λ = 0.71073 Å) in the ω scanning mode at 293 K, respectively. Data collection, reduction, and absorption correction were performed by the CRYSTALCLEAR program.59 The structures were solved by direct methods using the SHELXS program60 (link) and refined by full-matrix least-squares techniques (SHELXL)61 (link) on F2. Hydrogen atoms were located by using the geometric method. Details of crystal data, data collections, and structure refinements are summarized in Table 3.
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