The changes in the chemical composition of the film’s surface and element content of the two collagen-based films were evaluated by the XPS test. A Kratos Analytical (UK) model Axis Ultra system with an Al Kα X-ray source (hν = 1486.6 eV, 150 W) was used in the XPS spectrometer and the C1s of C–C (about 284.6 eV) was chosen as the reference line. Besides, the wide scanning was operated with pass energy of 140 eV, while the high-resolution region scans were gathered with the pass energy of 55 eV. In addition, analysis of the surface of different samples and quantification results of the two samples were obtained.
Axis ultra system
Manufactured by Shimadzu
Sourced in United Kingdom, Japan
The Axis Ultra system is a high-performance X-ray photoelectron spectroscopy (XPS) instrument. It is designed to provide precise analysis of the chemical composition and electronic structure of solid surfaces and thin films. The system features advanced capabilities for depth profiling, imaging, and quantitative analysis.
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Lab products found in correlation
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Jem 2010 electron microscope, by JEOL (1 mentions)
Lambda 950, by PerkinElmer (1 mentions)
D8 advance, by Bruker (1 mentions)
Dimension icon, by Bruker (1 mentions)
Dsa100, by Krüss (1 mentions)
Cypher s, by Oxford Instruments (1 mentions)
Smartlab x ray diffractometer, by Rigaku (1 mentions)
8400s spectrometer, by Shimadzu (1 mentions)
X pert pro mpd, by Philips (1 mentions)
7 protocols using axis ultra system
1
XPS Analysis of Collagen-based Films
2
Characterization of CuInS2 Nanostructures
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The phase and crystallographic structure of the prepared products were characterized by X-ray diffraction on a Bruker D8 Advance X-ray powder diffractometer (XRD) with Cu Kα radiation source (λ = 0.15418 nm). Scanning electron microscopy (SEM) images were acquired using a FEI Nova NanoSEM 450 scanning electron microscope (FEI, Hillsboro, OR, USA). Transmission electron microscopy (TEM) images were performed on a JEOL JEM-2010 electron microscope (JEOL, Akishima-shi, Tokyo, Japan) operating at 200 kV. X-ray photoelectron spectroscopy (XPS) analysis was performed with a Kratos Axis Ultra system using monochromatic Al Kα X-rays (1,486.6 eV). The UV-vis absorption spectra were obtained by using UV-vis Spectrometer (Perkin-Elmer, Lambda 950, Waltham, MA, USA). The simulated crystal structures and wurtzite XRD patterns of CuInS2 were obtained by using Diamond 3.2 programs.
3
Surface Characterization of PEEK and PEPA
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The surface chemical composition of the substrates was investigated through X-ray photoelectron spectroscopy (XPS). XPS data were acquired using a Kratos Axis Ultra system with a monochromatized Al Kα source at a take off angle of 20°. The sample charging was calibrated to the reference of C1s set at 284.8 eV. Spectra data was analyzed using the analysis software XPS PEAK95 Version 3.1.
Surface wettability of the intact PEEK and PEPA was determined via static water contact angle measurements using the sessile drop method with a goniometer (Krüss DSA100, Germany). A volume of 3 μl ultra-pure water was placed on the surface of the samples using a motor driven syringe at room temperature. The mean value was calculated using four measurements.
The surface topography of PEEK samples was detected by atomic force microscopy (AFM; Dimension icon, Bruker, USA) in the tapping mode at room temperature. An area of 20 μm × 20 μm was imaged, and the roughness was calculated using the software NanoScope Analysis.
Surface wettability of the intact PEEK and PEPA was determined via static water contact angle measurements using the sessile drop method with a goniometer (Krüss DSA100, Germany). A volume of 3 μl ultra-pure water was placed on the surface of the samples using a motor driven syringe at room temperature. The mean value was calculated using four measurements.
The surface topography of PEEK samples was detected by atomic force microscopy (AFM; Dimension icon, Bruker, USA) in the tapping mode at room temperature. An area of 20 μm × 20 μm was imaged, and the roughness was calculated using the software NanoScope Analysis.
4
X-ray Photoelectron Spectroscopy Protocol
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XPS measurements were performed on
a Kratos Axis Ultra system using monochromatized Al Kα radiation at hν = 1486.6 eV. The binding
energy scale was calibrated to the Fermi edge and the C 1s peak at
284.8 eV.
a Kratos Axis Ultra system using monochromatized Al Kα radiation at hν = 1486.6 eV. The binding
energy scale was calibrated to the Fermi edge and the C 1s peak at
284.8 eV.
5
XPS Analysis of Surface Composition
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X-ray photoelectron spectroscopy (XPS) profiles were obtained with an AXIS Ultra system (Kratos Analytical Ltd), equipped with Al Ka radiation (1486.7 eV). The C 1 s peak at 284.6 eV was used as an internal standard for calibration of binding energies.
6
Comprehensive Material Characterization Protocol
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The powder X-ray diffraction patterns are collected with a Rigaku SmartLab X-ray diffractometer in transmission mode using Cu-Kα radiation in the 2θ range of 10–70° with a scan-step width of 0.02°. The theoretical simulation of XRD patterns is calculated by Mercury, a free software designed by Cambridge Crystallographic Data Centre (https://www.ccdc.cam.ac.uk/Community/csd-community/freemercury/ ). The XPS measurements are made using a Kratos Axis Ultra system, equipped with a monochromatic AlKα X-ray source. The diameter of the spot size is about 110 µm, and a charge neutralizer is used to correct surface charging. HRTEM imaging is carried out on an aberration-corrected JEOL 2200FS transmission electron microscope operated at 200 keV. The chemical composition and element distribution are determined by energy dispersive X-ray spectroscopy attached to the transmission electron microscope. The AFM images are performed by Asylum Research Cypher S under the tapping mode with the AC160TS tip at room temperature under ambient conditions.
7
Characterization of Composite Foam Structure
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SEM micrographs of the cross-section of the composite foam were acquired using a TESCAN VEGA/XMU microscope (Czech). The infrared spectra of powders were obtained by a Shimadzu 8400S Spectrometer (Japan) with a 4 cm−1 spectral resolution. Compressed KB pellets mixed with prepared powder were used to produce all spectra in the 500–4000 cm−1 range. XRD patterns were recorded using a diffractometer with Cu Kα (λ = 1.54 Å) radiation (X'Pert Pro MPD, Philips, Germany). A 532 nm laser was used as the excitation source for the Raman spectroscopy, which was carried out on a Takram micro Raman spectrometer (TeksanTM, Iran) with a power output of 90 mW and a spectral resolution of 6 cm−1. A KRATOS Axis Ultra system was used to conduct the XPS measurements. The apparatus is equipped with a charge neutralization system, an aspherical mirror electron analyzer, and a monochromatized Al K X-ray source. The carbonaceous Au 4f line (84.2 eV) was used as the reference to calibrate the binding energies. A T-type thermocouple inserted in the test sample was attached to a data logger module (Advantech USB-4718) to collect the test temperature fluctuations, while an infrared camera (Ti27, Fluke, USA) recorded the temperature of composite.
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