Dimension fastscan afm instrument

The
AFM analysis of OXCBZ material resulting from sublimation experiments
was performed using a Bruker Dimension FastScan AFM instrument. All
images were collected under ambient conditions in PeakForce Tapping
mode using Bruker ScanAsyst Air probes with the nominal spring constant k = 0.4 N/m and a nominal tip radius of 2 nm. The NanoScope
Analysis software package (v.1.9) was utilized to apply first-order
flattening to all height sensor images obtained and measure the diameter
of sample features that were of interest.

AFM was carried out using a Dimension FastScan AFM instrument (Bruker) operating in tapping mode and using FastScan A probes (Bruker). Fibril morphology was investigated in tapping mode, using samples that were diluted between 1:50 and 1:1000 in 10 mM HCl. After dilution, 25 μL of each sample was deposited onto freshly cleaved mica and incubated for 30 min at room temperature. After incubation, samples were washed using distilled water and dried using a stream of compressed air. Alternatively, 25 μL of the sample was applied on the mica surface and left to dry at ambient conditions. Nanoscope analysis software (Version 1.5 or 1.9, Bruker) was used to process the image data by flattening the height topology data and removing the tilt and scanner bow.