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Supertwin

Manufactured by Thermo Fisher Scientific
Sourced in United States

The SuperTwin is a high-performance laboratory centrifuge designed for a wide range of applications. It features a compact and durable construction, offering reliable and efficient operation.

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3 protocols using supertwin

1

Characterization of Nanoparticles via Microscopy

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Electron microscopy observations were carried out at the LMA-INA-Universidad Zaragoza facilities. Scanning electron microscopy (SEM, Inspect F50; FEI, Eindhoven, the Netherlands) at an accelerating voltage of 10–15 kV was employed to determine the size (100 NPs were measured for performing the statistical analysis) and morphology of the synthesized NPs. The freshly prepared NPs were mixed during 1.5 hours with the same volume of phosphotungstic acid solution (7.5% w/v) used as contrast agent. The dispersion was centrifuged and washed three times with Milli-Q water and later resuspended. A drop of the resulting NP suspension was placed on a glass slide, dried in air, and coated with platinum under vacuum before SEM observation.
Transmission electron microscopy (TEM) observations were carried using a T20-FEI microscope with a LaB6 electron source fitted with a “SuperTwin®” (FEI Company, Hillsboro, OR, USA) objective lens allowing a point-to-point resolution of 2.4 Å. Approximately 2.5 μL suspension of stained PLGA NPs was pipetted onto a transmission electron microscopy copper grid with a continuous carbon film. Samples were let to evaporate completely and then were analyzed.
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2

Advanced Electron Microscopy Characterization

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Preliminary electron microscopy observations were carried out using a T20-FEI microscope with a LaB6 electron source fitted with a “SuperTwin®” objective lens allowing a point-to-point resolution of 2.4 Å. Aberration corrected scanning transmission electron microscopy (Cs-corrected STEM) images were acquired using a high angle annular dark field detector in a FEI XFEG TITAN electron microscope operated at 300 kV equipped with a CETCOR Cs-probe corrector from CEOS Company allowing formation of an electron probe of 0.08 nm. The geometric aberrations of the probe-forming system were controlled to allow a beam convergence of 24.7 mrad half-angle to be selected. Elemental analysis was carried out with an EDS (EDAX) detector which allows performing EDS experiments in the scanning mode.
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3

High-Resolution Electron Microscopy Imaging

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Preliminary electron microscopy observations were carried out at LMA-INA-UNIZAR using a T20-FEI microscope with a LaB6 electron source fitted with a “SuperTwin®” objective lens allowing a point-to-point resolution of 2.4 Å. HAADF-STEM images were obtained using an aberration corrected scanning transmission electron microscope. Images were acquired using a high angle annular dark field detector in a FEI XFEG TITAN electron microscope operated at 300 kV, equipped with a CETCOR Cs-probe corrector from CEOS Company allowing formation of an electron probe of 0.08 nm.
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