Phi quantera 2
The PHI Quantera II is a high-performance X-ray photoelectron spectroscopy (XPS) system designed for materials analysis. It provides accurate surface and elemental composition data for a wide range of samples.
Lab products found in correlation
12 protocols using phi quantera 2
Surface Characterization of ZnO-Ag Nanostructures
Comprehensive Materials Characterization of Ni-Deposited Black Phosphorus
was determined by wavelength-dispersive
X-ray fluorescence spectroscopy (WDS-XRF; ZSX Primus II, Rigaku).
X-ray diffraction (XRD; SmartLab, Rigaku) with Cu Kα radiation
and Raman microscopy system (T64000; HORIBA, Ltd.) using the 532 nm
line of a Nd:YAG laser were applied to identify the crystal structures
of the samples. Elemental analysis was conducted by X-ray photoelectron
spectroscopy (XPS; PHI Quantera II, ULVAC-PHI, Inc.) with an X-ray
(monochromatic radiation Al Kα) beam diameter of 100 μm
operated at 25 W. XPS spectra were calibrated using the binding energy
of hydrocarbon (C–C, C–H groups) at 284.6 eV. The Ni-deposition
morphology on black phosphorus was observed by field emission scanning
electron microscopy (FE-SEM; JSM-7000F, JEOL Co., Ltd.) accompanied
by energy-dispersive spectroscopy (EDS) and scanning transmission
electron microscopy (STEM; HD2300A, Hitachi).
Comprehensive Characterization of Advanced Materials
conducted using a Bruker D8 Advance X-ray diffractometer at 40 kV
using monochromatized Cu Kα (λ = 1.5406 Å)
radiation in the 2θ range of 10–80°. The morphologies
of the materials were determined using a Zeiss Gemini Ultra Plus field-emission
scanning electron microscope (FESEM) operated at an accelerating voltage
of 0.02–30 kV and a 200 kV JEOL HRTEM. XPS was used to analyze
surface properties equipped with Al Κα as a
radiation source on an ULVAC PHI Quantera II high-resolution XPS.
The work function and d-band measurements were performed with a full-field
soft X-ray tomography beamline 24A of the Taiwan Photon Source (TPS)
at the National Synchrotron Radiation Research Center (NSRRC). EXAFS
was recorded with the 17C wiggler beamline of the Taiwan Light Source
(TLS) or XRD beamlines 20A and 44A of TPS at NSRRC. FTIR spectra were
recorded on a Bruker VERTEX 700 spectrometer with a wavelength range
between 4000 and 400 cm–1. Elemental analyses were
obtained by -EDX, 200 kV, JEOL, USA) and ICP-OES, (PerkinElmer, SCIEX
Elan 500). The zeta potential (ζ) was measured using a Malvern
Zetasizer, and adsorption studies were performed using Micrometrics
3Flex.
Characterization of Carbon Dots
X-ray Photoelectron Spectroscopy Protocol
Characterization of DMA-MPC Copolymer Microspheres
Chemical and Surface Characterization of VBDMH
The surface chemical bonding and atomic composition were characterized by attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR, Varian 640-IR, Santa Clara, CA, USA) and X-ray photoelectron spectroscopy (XPS, PHI Quantera II, ULVAC-PHI, Inc. Kanagawa, Japan). The ATR-FTIR spectra were acquired after 64 scans with a resolution of 4 cm−1. The X-ray source for the XPS measurement was the monochromatic Al-Kα (hν = 1486.6 eV, step size = 0.1 eV, pass energy = 55 eV) with the take-off angle at 45°. The high-resolution spectra were deconvoluted by mixing the Gaussian–Lorentzian functions using the free software program, XPSPEAK. Quantification of the element was performed on the peak areas with the consideration of sensitivity factors of each element provided by the instrument maker.
To determine the surface hydrophilicity of various modified and pristine PU substrates, static water contact angle measurements (WCA; Model 100SB, Sindatek, Taipei, Taiwan) were performed at room temperature (25 °C) using the sessile drop method with deionized water droplets.
Structural Characterization of c-PEGR Gel
XPS Analysis of Barite and Mn3O4
Comprehensive Characterization of Nanocomposite Materials
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