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12 protocols using phi quantera 2

1

Surface Characterization of ZnO-Ag Nanostructures

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A 3D laser scanning microscope (Model: VK-X100K, Keyence, Itasca, IL, USA) was used to observe the differences in the surface features of the bare micropipette tips, Ag-sputtered tips, and the ZnO grown tips, along with surface thickness measurements of the sputtered and grown thin films. Morphological analysis of the grown nanostructures was performed using a field emission scanning electron microscope (FE-SEM) (Model: Hitachi, S-4800 SEM, Chiyoda City, Japan). The samples used for SEM analysis were prepared by taking a thin film of the ZnO grown over sputtered Ag film on the tip, followed by subsequent coating on a carbon-coated copper grid. Elemental analysis was performed using energy dispersive X-ray spectroscopy (EDS) integrated with an SEM system. The vibrational mode signatures of the grown nanostructures were studied using a Raman spectrometer (Model: XploRA, Horiba, Kyoto, Japan) in the range of 0–4000 cm−1. The binding energy profiles and surface level analysis of elements, along with their bonding characteristics, were obtained with an X-ray photoelectron spectrometer (XPS) (Model: PHI Quantera II, ULVAC-PHI, Chigasaki, Japan).
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2

Comprehensive Materials Characterization of Ni-Deposited Black Phosphorus

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The Ni content
was determined by wavelength-dispersive
X-ray fluorescence spectroscopy (WDS-XRF; ZSX Primus II, Rigaku).
X-ray diffraction (XRD; SmartLab, Rigaku) with Cu Kα radiation
and Raman microscopy system (T64000; HORIBA, Ltd.) using the 532 nm
line of a Nd:YAG laser were applied to identify the crystal structures
of the samples. Elemental analysis was conducted by X-ray photoelectron
spectroscopy (XPS; PHI Quantera II, ULVAC-PHI, Inc.) with an X-ray
(monochromatic radiation Al Kα) beam diameter of 100 μm
operated at 25 W. XPS spectra were calibrated using the binding energy
of hydrocarbon (C–C, C–H groups) at 284.6 eV. The Ni-deposition
morphology on black phosphorus was observed by field emission scanning
electron microscopy (FE-SEM; JSM-7000F, JEOL Co., Ltd.) accompanied
by energy-dispersive spectroscopy (EDS) and scanning transmission
electron microscopy (STEM; HD2300A, Hitachi).
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3

Comprehensive Characterization of Advanced Materials

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XRD measurements were
conducted using a Bruker D8 Advance X-ray diffractometer at 40 kV
using monochromatized Cu Kα (λ = 1.5406 Å)
radiation in the 2θ range of 10–80°. The morphologies
of the materials were determined using a Zeiss Gemini Ultra Plus field-emission
scanning electron microscope (FESEM) operated at an accelerating voltage
of 0.02–30 kV and a 200 kV JEOL HRTEM. XPS was used to analyze
surface properties equipped with Al Κα as a
radiation source on an ULVAC PHI Quantera II high-resolution XPS.
The work function and d-band measurements were performed with a full-field
soft X-ray tomography beamline 24A of the Taiwan Photon Source (TPS)
at the National Synchrotron Radiation Research Center (NSRRC). EXAFS
was recorded with the 17C wiggler beamline of the Taiwan Light Source
(TLS) or XRD beamlines 20A and 44A of TPS at NSRRC. FTIR spectra were
recorded on a Bruker VERTEX 700 spectrometer with a wavelength range
between 4000 and 400 cm–1. Elemental analyses were
obtained by -EDX, 200 kV, JEOL, USA) and ICP-OES, (PerkinElmer, SCIEX
Elan 500). The zeta potential (ζ) was measured using a Malvern
Zetasizer, and adsorption studies were performed using Micrometrics
3Flex.
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4

Characterization of Carbon Dots

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FTIR spectra (Perkin Elmer Spectrum 400 spectrophotometer) were conducted in the range of 400–4000 cm−1 with the samples dispersed in KBr. The XRD analyses were performed using the powder XRD (PANalytical-Empyrean) with Cu Kα radiation at a scanning speed of 0.02 s−1. A micro-PL spectroscope (Renishaw, inVia Raman Microscope) was used to acquire the PL spectra with an excitation wavelength of 325 nm. UV–vis DRS was obtained using a Shimadzu UV-2600 spectrophotometer equipped with an integrating sphere attachment with barium sulfate (BaSO4) as a reference. The surface chemical composition of samples was analyzed by XPS (PHI Quantera II, Ulvac-PHI, Inc.) with an Al Kα radiation source. High resolution transmission electron microscope (HRTEM, FEI-TECNAI F20) images were obtained at 200 kV. PL spectra of CDs solution were acquired with a PL spectrophotometer (Perkin Elmer LS 55) with different excitation wavelengths ranging from 300 to 540 nm.
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5

X-ray Photoelectron Spectroscopy Protocol

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X-ray Photoelectron Spectroscopy (XPS) analyses were conducted on a PHI QUANTERA-II instrument (Ulvac-PHI Inc., Chigasaki, Kanagawa, Japan) equipped with a monochromatized Al KRX-ray source operated at 25 W and 15 kV. For wide-scan spectra, an energy range of 0–1100 eV was used with a pass energy of 280.00 eV and a step size of 1.00 eV. High-resolution spectra were collected at a 26.00 eV pass energy using a step size of 0.025 eV. The XPS results were further fitted in a nonlinear least squares curve fitting program (XPS-peak-41 software, Version 4.0).
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6

Characterization of DMA-MPC Copolymer Microspheres

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The three mass ratios of the DMA-MPC copolymers (4 mg/mL) were dispersed in Tris-HCl buffer (pH = 8.5, 1 M) respectively, and then three equal volumes of microsphere solutions (2 mL) were added to the above solutions (4 mL), which were placed in a dark shaker for 24 h. Afterwards, the microspheres were collected by centrifugation and thoroughly rinsed with deionized water. The microspheres were freeze-dried and sputtered coated with platinum before investigation using the SEM in 5 kV. The surface elements of the samples were characterized by an X-ray photoelectron spectroscopy (XPS, PHI Quantera II, Ulvac-Phi Inc., Japan). The infrared spectra of the samples were recorded by a Fourier transform infrared spectrometer (FTIR, Bruker, Horiba, Germany).
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7

Chemical and Surface Characterization of VBDMH

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The chemical structure of VBDMH was confirmed by a nuclear magnetic resonance spectrometer (NMR, AV-500, BRUKER, 500 MHz, Rheinstetten, Germany). The deuterated DMSO was added as a solvent.
The surface chemical bonding and atomic composition were characterized by attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR, Varian 640-IR, Santa Clara, CA, USA) and X-ray photoelectron spectroscopy (XPS, PHI Quantera II, ULVAC-PHI, Inc. Kanagawa, Japan). The ATR-FTIR spectra were acquired after 64 scans with a resolution of 4 cm−1. The X-ray source for the XPS measurement was the monochromatic Al-Kα (hν = 1486.6 eV, step size = 0.1 eV, pass energy = 55 eV) with the take-off angle at 45°. The high-resolution spectra were deconvoluted by mixing the Gaussian–Lorentzian functions using the free software program, XPSPEAK. Quantification of the element was performed on the peak areas with the consideration of sensitivity factors of each element provided by the instrument maker.
To determine the surface hydrophilicity of various modified and pristine PU substrates, static water contact angle measurements (WCA; Model 100SB, Sindatek, Taipei, Taiwan) were performed at room temperature (25 °C) using the sessile drop method with deionized water droplets.
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8

Structural Characterization of c-PEGR Gel

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SEM (Sirion 200, FEI, USA) was used to characterize the morphology and structure of the c‐PEGR and c‐PEGR gel. Vertex 80/80V Fourier Transform Infrared Spectrometer from Bruker Optics was used to perform the FTIR measurements. XPS data were collected from a PHI Quantera II (Ulvac‐Phi Inc) at room temperature. 1H‐SSNMR spectra were measured using a solid‐state NMR instrument (JNM‐ECZ600R). The resonance frequency was 600 MHz, the tube diameter was 3.2 mm, and the magic angle spinning frequency was 12 kHz. The D‐exchange fully occurred by mixing 0.1 mL of solid material (c‐PEGR) with 0.5 mL of deuterium oxide (D2O) and maintaining the mixture at 60 ℃ for 12 h. Afterwards, the water was removed in a vacuum oven at 100 ℃.
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9

XPS Analysis of Barite and Mn3O4

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X-ray photoelectron spectroscopy (XPS, PHI Quantera II, Ulvac-Phi Inc. Japan) was used to analyze the elemental composition of barite and Mn3O4. The powdered barite and Mn3O4 were tableted using aluminum foil, double-sided tape and a hydraulic press and then tested.
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10

Comprehensive Characterization of Nanocomposite Materials

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The nanostructures and morphology of the as-synthesized samples were imaged under a field-emission scanning electron microscope (FESEM, JSM-7600) and transmission electron microscope (TEM, JEM-2100F). Crystalline phase and structure of the samples were identified by X-ray diffraction (XRD, Bruker D8). Raman spectroscopy was conducted by a confocal Raman setup with a 532 nm lazer excitation (WITec Instruments Corp, Germany). The nanocomposite content breakdown was measured by thermogravimetric analysis (TGA, Shimadzu, DTG-60). The chemical valence states of the samples were investigated with a X-ray photoelectron spectroscope (XPS, PHI Quantera II, Physical Electronics, Adivision of ULCAV-PHI).
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