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Dxr smart raman spectrometer

Manufactured by Thermo Fisher Scientific
Sourced in United States, United Kingdom

The DXR smart Raman spectrometer is a laboratory instrument used for spectroscopic analysis. It is designed to capture Raman scattering data from samples. The core function of the DXR smart Raman spectrometer is to provide accurate and reliable Raman spectroscopy measurements.

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24 protocols using dxr smart raman spectrometer

1

Infrared and Raman Spectroscopy of Samples

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Infrared spectra were recorded with a Thermo Fischer Scientific Nicolet 380 FTIR spectrometer (Madison, WI, USA), controlled by OMNIC software and equipped with a deuterated triglycine sulfate (DTGS) detector with KBr window. A 1 mg sample was gently mixed in an agate mortar with 100 mg spectroscopy-grade KBr (Merck, Darmstadt, Germany) and then pressed into pellet form with a hydraulic press (Specac, Orpington, UK). The FTIR spectra were measured in triplicate in the spectral range of 4000–400 cm–1 with resolution of 2 cm–1 (16 scans). The background spectrum was recorded before each measurement was taken.
The Raman spectra were registered on a Thermo Fisher Scientific DXR SmartRaman spectrometer (Madison, WI, USA), with a Raleigh filter, charge-coupled detector (CCD) and OMNIC software. Measurements in triplicate were performed in the spectral range of 3413–99 cm–1 with a spectral resolution of 2 cm–1. The spectrometer was equipped with 15-mW DXR 780 nm laser (aperture of 25 µm) and samples were exposed to laser light for a period of 1 s.
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2

Comprehensive Characterization of CD Systems

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A Hitachi F-7000 FL spectrophotometer (Hitachi High-tech), TU-1901 dual-beam ultraviolet-visible spectrophotometer (Beijing General Analysis General Instruments), and DXR smart Raman spectrometer (Thermo, United States) with an excitation wavelength of 633 nm, laser power of 3.5 mW, slit width of 50 μm, and acquisition time of 5 s were used to measure the CD system signals. The following were used to synthesize and characterize the CD systems: a desktop centrifuge (Zhuhai Heima Medical Instrument); ultrasonic cleaner (Shanghai Kedao Ultrasonic Instrument); SYZ-550 quartz sub-boiling distilled water device (Jiangsu Crystal Glass Instrument Factory); 79-1 magnetic heating stirrer (Jiangsu Zhongda Instrument Factory); HH-S2 electric heating thermostatic water bath (Jintan Dadi Automation Instrument Factory); KP-216 air energy light wave furnace (Zhongshan Qiaokang Electric Manufacturing, rated power 1200 W); pH meter (Mettler-Toledo Instruments Shanghai); Nano-2s nanometer particle size and zeta potential analyzer (Malvern, United Kingdom); and an S-4800 field emission scanning electron microscope (SEM; Hitachi Hi-tech).
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3

Spectroscopic Analysis of Samples

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A DXR SmartRaman Spectrometer (Thermo Fisher Scientific, Waltham, MA, USA) with a laser wavelength of 633 nm and a power of 3.0 mW, Cary Eclipse Fluorescence Spectrophotometer (Varian Company, Salt Lake City, UT, USA), TU-1901 double beam ultraviolet (UV)–visible spectrophotometer (Beijing Purkinje General Instrument Co., Ltd., Beijing, China) and a thermostatic bath were used.
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4

Multimodal Characterization of Materials

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A model of DXR smart Raman spectrometer (Thermo companies in the United States) with a laser wavelength of 633 nm and power of 2.5 mW, a model of the F-7000 Hitachi Fluorescence spectrometer (Hitachi Company, Japan), a model of the TU-1901 double-beam UV-Vis spectrophotometer (Beijing Purkinje General Instrument Co., Ltd., China), a model of FEI 200 FEG field emission scanning electron microscope (Dutch philips), and a model of C-MAG HS7 incubation magnetic stirrer (Germany IKA company) were used.
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5

Comprehensive Characterization of C@TiO2-HNBs

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The morphology of the C@TiO2-HNBs samples was observed using a transmission electron microscope (TEM) (Tecnai G2 20, USA) with an acceleration voltage of 200 kV. Scanning electron microscopy (SEM) images were obtained on a field emission scanning electron microscope (Hitachi, Japan). X-ray diffraction (XRD) patterns were obtained using a D8-advance X-ray diffractometer (Bruker, German) with Cu Kα radiation at a scan rate of 0.02° 2θ s−1. The accelerated voltage and applied current were 40 kV and 80 mA, respectively. The infrared spectra (IR) of these samples were obtained using Fourier transform infrared spectroscopy (Nexus 470 FT-IR, Shimadzu, Japan). X-ray photo-electron spectroscopy (XPS) measurements were performed using a Kratos XSAM800 XPS system with Mg Kα radiation and a charge neutralizer; all of the binding energies were referenced to the C 1s peak at 284.8 eV of the surface adventitious carbon. Raman spectra were used to characterize the optical properties and were obtained using a DXR Smart Raman Spectrometer (Thermo, USA). A UV2600UV-vis spectrophotometer (Shimadzu, Japan) was used for UV-vis diffuse reflectance spectroscopy (DRS) and BaSO4 was used as the reference sample. Photoluminescence (PL) spectra were recorded using an F-7000 Fluorescence Spectrophotometer (Hitachi, Japan).
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6

Comprehensive Instrumentation for Materials Characterization

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A model of a DXR smart Raman spectrometer (Thermo Fisher Scientific, Waltham, MA, USA) with laser of 633 nm, power of 2.5 mW, collect time of 5 s and slit of 25 μm, a model of F-7000 Hitachi fluorescence spectrometer (Hitachi Company, Tokyo, Japan) with volt = 500 V, excited slit = emission slit = 5 nm, emission filter = 1%T attenuator and λex − λem = Δλ = 0, and a model of TU-1901 double beam UV-Vis spectrophotometer (Beijing Purkinje General Instrument Co., Ltd., Beijing, China) were used. A model S-4800 scanning electron microscope (SEM, Hitachi High-Technologies Corporation, Tokyo, Japan) was used to record the SEM images. A model of JEM-800 H Field emission transmission electron microscope (Hitachi High-Technologies Corporation, Tokyo, Japan) was used to record the transmission electron microscope (TEM) and energy spectrum, with lattice resolution of 0.204 nm, dot resolution of 0.45 nm, acceleration voltage of 200 kV and tilt angle of 25 degrees. A model of C-MAG HS7 Heating magnetic stirrer (IKA Company, Berlin, Germany), Constant temperature magnetic stirrer (Beijing Kewei Yongxing Instrument Company, Ltd., Beijing, China), and KC-6120 Atmospheric sampler (Laoshan Mountain Electronic Instrument Factory Company, Ltd., Laoshan, China) were used.
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7

Raman Spectroscopy of Materials

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Raman spectra were recorded on a DXR Smart Raman spectrometer (Thermo Fisher Scientific, Madison, WI, USA), equipped with a 15-mW DXR 780 nm laser with a slit width of 25 µm, Raleigh filter, CCD detector and OMNIC software. The measurements were run over the range of 3413–99 cm−1 with resolution of 2 cm−1, at ambient temperature. Exposure time was 1 s (twice).
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8

Multimodal Characterization of Materials

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A model of DXR smart Raman spectrometer (Thermo Fisher, Waltham, MA, USA) was used with a laser wavelength of 633 nm and a power of 2.5 mW. A model of the F-7000 fluorescence spectrophotometer (Hitachi Co., Chiyoda-ku, Japan), a model of the TU-1901 double beam UV–vis spectrophotometer (Beijing Purkinje General Instrument Co., Ltd., Beijing, China), a model of FEI Quanta 200 FEG scanning electron microscope (FEI Co., Ltd., Eindhoven, Holland), and a model of SK8200LH ultrasonic reactor (Shanghai Kudos Ultrasonic Instrument Co., Ltd., Shanghai, China) were used.
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9

Raman Spectroscopy of Solid Lipid Nanoparticles

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Raman measurements were performed by using a DXR-Smart Raman Spectrometer (Thermo Fisher Scientific). The experimental set-up was equipped with a Universal Platform Sampling (UPS) accessory. The spectra were acquired using an He-Ne laser source operating at 785 nm, with a power output of 24.0 mW and a full range grating of 400 lines/mm; all the spectra were recorded over the wavenumber range of 50–3300 cm−1, with a resolution of 1.9 cm−1.
The 180-degree sampling accessory was used to carry out the measurements, and two different sample holders were used. In particular, for SLNs and RT-SLNs, which originally appeared already in the form of freeze-dried pellets, a special sample holder was used; instead, RT and Phospholipon® 80H, originally in the form of powders, and Tween 80, in the form of a viscous liquid, were allocated inside dedicated cuvettes.
In order to maximize the signal-to-noise ratio (S/R), 64 sample frames with an exposure time of 10 s, for a total acquisition time of 64 s per spectrum, were set before each acquisition.
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10

Comprehensive Fiber Characterization

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Pure cotton and CC fibers were characterized using a Nexus 670 FTIR spectrometer, (4 cm−1 resolution and 32 scans) using diamond attenuated total reflectance (DATR). The Raman spectrum of the CC fibers was measured using a Thermo Scientific DXR SmartRaman spectrometer (532 nm excitation). Surface structure and morphology of the pure and CC fibers were characterized using a Hitachi SU-70 FE-SEM scanning electron microscope (SEM). The optical characterization of the CC fibers was determined using a diffuse reflectance accessory attached to a Cary 6000i UV-vis-NIR spectrophotometer (Agilent Technologies). X-ray photoelectron spectroscopy (XPS) measurements of the CC fibers were conducted using a PHI VersaProbe III Scanning XPS Microprobe.
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