Jem 2100f tem

Manufactured by Ametek

The JEM-2100F TEM is a transmission electron microscope (TEM) developed by Ametek. It is designed to provide high-resolution imaging and analysis of a wide range of materials at the nanoscale level. The JEM-2100F TEM is capable of imaging and analyzing the internal structure and composition of samples with a resolution down to the atomic scale.

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Lab products found in correlation

Inca software, by Oxford Instruments (1 mentions) Orius sc1000, by Ametek (1 mentions) Quanta 3d dual beam, by Thermo Fisher Scientific (1 mentions) Cm20 tem, by Thermo Fisher Scientific (1 mentions) Oneview camera, by Ametek (1 mentions)

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JEM-2100F (8 citations)

2 protocols using jem 2100f tem

STEM and EDS Analysis of Nanomaterials

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The
samples were prepared
by placing 10 μL of the sample solution on 200-mesh carbon-coated
Cu grids (Electron Microscopy Science, USA). Imaging in scanning transmission
microscopy (STEM) mode and energy dispersive X-ray spectroscopy (EDS)
analysis were performed on a JEOL JEM-2100F TEM operating at 200 kV,
equipped with Gatan Orius SC 1000 (2 k × 4 k), Gatan high-angle
annular dark-field (HAADF), Gatan annular bright field (BF), and EDS
detectors (Oxford Instruments INCA EDS 80 mm X-Max detector system
with STEM capability). The EDS spectra from the whole area of the
individual particles were taken. Measurements over five particles
per sample were used for elemental analysis. The obtained EDS spectra
were quantitatively analyzed with a standardless approach and k-factors provided by the Inca software (Oxford Instruments).

Kim E., Agarwal S., Kim N., Hage F.S., Leonardo V., Gelmi A, & Stevens M.M. (2019). Bioinspired Fabrication of DNA–Inorganic Hybrid Composites Using Synthetic DNA. ACS Nano, 13(3), 2888-2900.

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Transmission Electron Microscopy Specimen Preparation

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Specimen preparation for transmission electron microcopy (TEM) was carried out using a FEI Quanta 3D dual-beam (SEM/FIB) system at Irvine Materials Research Institute (IMRI), University of California-Irvine (UCI), USA. Typical focus ion beam (FIB) procedures were applied to TEM specimen preparation and low voltage (5 kV) was used for the final thinning to reduce ion-beam-related sample surface damage. TEM samples were examined in a Philips/FEI CM-20 TEM with a LaB6 filament operated at 200 kV and images were recorded using a Gatan CCD camera (Orius 832) and Digital Micrograph software. High-resolution TEM (HRTEM) observations were conducted in a JEOL JEM-2100F TEM equipped with Gatan Oneview camera. TEM/HRTEM experiments enable us to characterize the microstructure of the films and understand the film growth and properties. Scanning TEM (STEM) and electron energy loss spectroscopy (EELS) experiments were conducted at LeRoy Eyring Center for Solid State Science, Arizona State University, using a Probe corrected-JEOL ARM200F S/TEM equipped with Gatan Enfinium EELS spectrometer and NION UltraSTEM 100 with Gatan Enfinium HR spectrometer with high stability electronics.

Hausmann S., Ye J., Aoki T., Zheng J.G., Stahn J., Bern F., Chen B., Autieri C., Sanyal B., Esquinazi P.D., Böni P, & Paul A. (2017). Atomic-scale engineering of ferroelectric-ferromagnetic interfaces of epitaxial perovskite films for functional properties. Scientific Reports, 7, 10734.

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