The mineral composition of waste materials, i.e., spent and ground LCD panels was analyzed with X-ray powder diffraction (XRD) method using the X’pert PROMPD spectrometer manufactured by Panalytical (Almelo, The Netherlands). The spectrometer was equipped with a PW 3050/60 goniometer (Panalytical), a graphite monochromator (Almelo, The Netherlands) as well as a Cu lamp. The analysis was conducted in the 5°–65° angle range (2θ). The obtained diffraction data was processed using Philips X’Pert Highscore software (High Score Plus v. 4.1). The mineral phases were identified on the basis of the PDF-2 database (release 2010), formalized by the ICDD.
Pw 3050 60 goniometer
Manufactured by Malvern Panalytical
The PW 3050/60 goniometer is a versatile X-ray diffraction (XRD) instrument manufactured by Malvern Panalytical. Its core function is to perform automated angular measurements of X-ray diffraction patterns, which are used to analyze the structural and chemical properties of materials.
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Lab products found in correlation
2 protocols using pw 3050 60 goniometer
1
Mineral Composition Analysis of LCD Waste
2
Characterization of HC11 and f-GNPs
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Samples (HC11 and f-GNPs) in the powder form were analysed by XRD with a PANalytical X'Pert Pro system equipped with a PW3050/60 goniometer. The X-ray source was a sealed copper tube operated at 40 keV and 40 mA.
Samples were studied for morphological properties using a SEM-Zeiss Sigma VP FEG-SEM microscope operating at 8 kV.
Samples were studied for morphological properties using a SEM-Zeiss Sigma VP FEG-SEM microscope operating at 8 kV.
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