Mica surface (Ted Pella, Inc.) was pre-treated with poly-L-lysine (0.1% w/v, Ted Pella, Inc.) to increase the adsorption of small RNA particles. 20 µL poly-l -lysine (5 µg/ml) was added onto freshly cleaved mica substrate and was incubated for 30 s. Then the surface was washed by 100 µL H2O and dried by compressed air. Annealed RNA solution was diluted to 50 nM and a drop of 5 µL was deposited onto pre-treated mica and incubated for 2 min. 20 µL TAE/Mg2+ buffer was further added. Imaging was performed in a fluid cell under tapping mode on a Multimode AFM (MMAFM 2, Veeco) with SNL-10 probe (Veeco, Inc.).
Mmafm 2
Manufactured by Veeco
The MMAFM 2 is a multi-mode atomic force microscope (AFM) designed for high-resolution imaging and analysis of surfaces. It provides a versatile platform for various imaging modes, including contact mode, tapping mode, and non-contact mode, allowing users to investigate a wide range of materials and applications.
Automatically generated - may contain errors
Lab products found in correlation
Mica surface, by Ted Pella (1 mentions)
Poly l lysine (pll), by Ted Pella (1 mentions)
H 800, by Hitachi (1 mentions)
Iraffinity 1, by Shimadzu (1 mentions)
X pert pro diffractometer, by Malvern Panalytical (1 mentions)
Belsorp max, by Microtrac (1 mentions)
Multilab 3000 spectrometer, by Microtech (1 mentions)
2 protocols using mmafm 2
1
Adsorption of Small RNA Particles on Mica
2
Characterization of ZIF-8 Nanostructures
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The crystal structures were estimated from XRD patterns collected using a PANalytical X'Pert PRO diffractometer with Cu Kα radiation, operated at 45 kV and 40 mA. The scan range was from 5 o to 45 o (2q) at 0.10 o /s. AFM images were obtained using a Veeco Instruments MMAFM-2. The samples were deposited on freshly exfoliated mica sheets as substrates. We measure 30 samples and calculated the average and standard deviation of the size and thickness, respectively. TEM images were obtained using a Hitachi H-800 at 200 kV. The distributions of ZIF-8 NSs were measured by DLS using ELSZ-2000 (Otsuka Electronics Co., Ltd.) at 25°C. FT-IR spectra were measured using a Shimazu IRAffinity-1S. The porosity of the products was characterized by Nitrogen adsorption measurements at 77 K using a BELSORPmax (MicrotracBEL). X-ray photoelectron spectroscopy (XPS) spectrum on C 1s and N 1s were obtained in a VG-Microtech Multilab 3000 spectrometer with an Al Kα radiation (1253.6 eV) as the energy source.
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