electron microscopy (TEM) were prepared by grinding materials in a
mortar and dispersing the powder onto holey carbon TEM grids. Samples
after electrochemical testing in nonaqueous solution were stored and
prepared for TEM in argon atmosphere, and a special Gatan Vacuum Transfer
holder was used for analysis. High-angle annular dark-field, annual
bright field scanning TEM (HAADF-STEM and ABF-STEM, respectively),
and ED patterns were acquired using a probe aberration corrected FEI
Titan3 (link) 80–300 electron microscope
operated at 300 kV.