tip scan high-speed AFM (BIXAM, Olympus, Tokyo, Japan), which was
improved based on a previously developed prototype AFM61 (link) in a solution of observation buffer containing
5 mM Tris–HCl (pH 8.0), 15 mM MgCl2, and 1 mM EDTA.
A 2 μL drop of the 1–3 nM sample in the observation buffer
was deposited onto a freshly cleaved mica surface (φ 3.0 mm)
and incubated for 1 min, followed by a 1 μL drop of 0.1% 3-aminopropyltriethoxysilane
and incubated for 3 min. Small cantilevers (9 μm long, 2 μm
wide, and 130 nm thick) with a spring constant of 0.1 N/m (USC–F0.8-k0.1-T12;
Nanoworld, Neuchâtel, Switzerland) were used to scan the sample
surface. The 320 × 240 pixel images were collected at a scan
line rate of 0.5 frames per sec. The imaged sequences were analyzed
using ImageJ software (