The microstructures of the GO-coated NiTi and GO/Ag-coated NiTi were observed in SEM (Quanta 250, FEI Co., Helsinki, Finland) at an operating voltage of 30 kV. The SEM analysis of cross-sections was done to visualize and verify the coatings on NiTi alloy. Elemental analysis of the coatings was performed using EDS (Quanta 250, FEI Co., Helsinki, Finland). A surface profilometer (Taylor Scan 150, Taylor Hobson Ltd., Leicester, UK) was used to evaluate the thickness of the surface coatings from the step height profile. An AFM (NX10, Park System, Suwan, South Korea) in contact mode was used to investigate the surface morphology. The Raman spectra were obtained using Raman spectroscopy (LabRAM HR Evolution, Horiba Scientific Inc., New York, USA) at room temperature with a laser at 532 nm with a grating of 1200 gr/mm and 200-μm slit. The crystallographic structures were analyzed by XRD diffractometer (AXS Model D8 Discover, Bruker AXS GmbH, Karlsruhe, Germany) operated at a generator voltage of 40 kV, and 40 mA. The data were collected in a 10° < 2θ < 90° range at a scan rate of 0.02°/step.
Axs model d8 discover
Manufactured by Bruker
Sourced in Germany, Belgium
The Bruker AXS Model D8 Discover is a versatile X-ray diffractometer designed for a wide range of materials analysis applications. The instrument provides high-resolution, high-speed data collection capabilities, enabling users to obtain detailed structural information about their samples.
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7 protocols using axs model d8 discover
1
Microstructural Characterization of GO-Coated NiTi
2
Characterization of Fe3O4 Nanoparticles
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The morphology, size and size distribution of the Fe3O4NPs were evaluated using transmission electron microscopy (TEM, Philips TECNAI 20). Fourier transform infrared (FT-IR) spectra were recorded by PERKIN ELMER using a KBr disk method. The amount of polymer content was determined by thermogravimetric analysis (TGA, MettlerToledo TGA/SDTA 851e). The weight loss of the dried samples was monitored under nitrogen atmosphere at temperatures ranging from 25 to 800 °C with a heating rate of 10 °C min−1. The crystalline phase was studied by X-ray diffraction (XRD, Bruker AXS Model D8 Discover). The hydrodynamic diameter and zeta potential were measured by dynamic light scattering (DLS) using a Malvern Nano ZSP instrument (UK) at room temperature at a scattering angle of 90°
3
X-Ray Diffraction Analysis of Lyophilized NLC
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After the NLC suspensions
were lyophilized, X-ray diffraction (XRD) analysis was performed (AXS
Model D8 Discover; Bruker, Germany) at room temperature. A copper
anode (Cu Kα radiation) was used as the X-ray source. The sample
was scanned from 3 to 35° with a scan speed of 0.2 s/step at
40 mA and 40 kV.
were lyophilized, X-ray diffraction (XRD) analysis was performed (AXS
Model D8 Discover; Bruker, Germany) at room temperature. A copper
anode (Cu Kα radiation) was used as the X-ray source. The sample
was scanned from 3 to 35° with a scan speed of 0.2 s/step at
40 mA and 40 kV.
4
X-Ray Diffraction Analysis of Rice Flour
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X-ray diffraction patterns of rice flour were performed with an X-Ray Diffractometer (Bruker AXS Model D8 Discover, Leipzig, Germany) equipped with a copper tube operating at 40 kV and 45 mA, and the spectra scanned over a diffraction angle (2θ) range of 5–40° at a rate of 0.02° 2θ/second. The percentage of crystallinity was calculated using this equation [14 (link)]:
5
Catalyst Characterization Techniques
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The characterization techniques of catalysts include XRD, N 2 physisorption, FTIR, NH 3 -TPD, SEM/EDX and TGA. The details are as follows; 2.3.1 Powder X-ray diffraction (XRD)
XRD patterns of catalysts were obtained by X-ray diffractometer (Bruker AXS Model D8 Discover) with CuK α radiation source (λ＝1.54439 Å) and Ni filter. The catalysts were scanned in the range of 2θ＝3 to 45°with a resolution of 0.02°.
XRD patterns of catalysts were obtained by X-ray diffractometer (Bruker AXS Model D8 Discover) with CuK α radiation source (λ＝1.54439 Å) and Ni filter. The catalysts were scanned in the range of 2θ＝3 to 45°with a resolution of 0.02°.
6
Biomineralization Characterization of Bioactive Films
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The bioactive character assessment of the films was exclusively performed in vitro. Samples of each film were immersed in SBF at 37 °C for 14 days. After that time, the samples were carefully washed in ultra-pure Milli-Q® water and dried at RT for 24 h. SBF was produced following the protocol developed by Kokubo and Takadama [85 (link)]. The bioactive character of the tested materials was assessed by SEM and EDS with a JSM-6010LV SEM-EDS (JEOL, Tokyo, Japan), and by XRD using Bruker AXS D8 Discover model (Bruker, Kontich, Belgium) operated at 40 kV and 40 mA using Cu Kα radiation. The detector was scanned over a range of 2θ angles from 15° to 60° at a step size of 0.04° and dwell time of 1 s per step. The analysis for phase identification was performed using analytical software EVA. The crystalline phases were indexed using the ICDD-2015 database (International Center for Diffraction Data).
7
In Vitro Bioactivity Assessment of Membranes
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Standard in vitro bioactivity studies were conducted by immersing three samples of each membrane composition in a freshly prepared simulated body fluid solution (1.0 SBF) [23 (link)] at 37 °C for 31 days. After that time, the samples were carefully washed in ultra-pure Milli-Q® water and dried at room temperature for 24 h. The elemental composition of the apatite layer formed on their surface was studied by SEM coupled with energy dispersive X ray spectroscopy (JEOL, Tokyo, Japan), by Fourier transform infrared spectroscopy (Infrared spectrometer-Jasco) in the attenuated total reflectance (ATR) transmission mode (spectra found in Figure S1 of the Supplementary Materials ), and by X-ray diffraction (XRD) using a Bruker AXS D8 Discover model (Bruker, Kontich, Belgium) operated at 40 kV and 40 mA using Cu Kα radiation. The XRD detector was scanned over a range of 2θ angles from 15° to 60° at a step size of 0.04° and dwell time of 1 s per step. The analysis for phase identification was performed using the analytical software EVA. The crystalline phases were identified and compared to the ICDD-2015 database (International Center for Diffraction Data).
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