Talos tem
The Talos TEM is a transmission electron microscope designed for high-resolution imaging and analysis of materials. It provides advanced capabilities for structural and elemental characterization at the nanoscale.
Lab products found in correlation
22 protocols using talos tem
Cryo-TEM imaging of LUV50s
SARS-CoV-2 Spike Protein Visualization
Continuous Rotation 3D Electron Diffraction
Two individual crystals were used for the data collection. For each crystal, several tilt series were collected within the total tilt range of ±60° with different exposure or rotation speed. For the first crystal (A), the rotation speed was kept constant (0.05 fraction of the standard speed setting) and the exposure per single frame was 0.5, 0.7 and 1 s (data sets A1, A2 and A3, respectively). These conditions resulted in effective tilt increments of 0.741, 1.043 and 1.481°, respectively. For the second crystal (B), the exposure time for a single frame was kept constant (0.5 s), while the rotation speed was varied from a 0.03 fraction of the standard speed setting to 0.1 (data sets B1–B8). The information on the continuously recorded data sets is summarized in Table S2 (
Minicollagen-1 Visualization via TEM
Structural Characterization of Thin Films
The transmission electron microscopy (TEM) of the cross-section of the film was performed using a JEOL ARM 200 CF scanning transmission electron microscope (STEM), operated at 200 kV and equipped with a field-emission gun and a high-angle annular dark-field detector (HAADF) for Z-contrast imaging.The TEM of the opening in the SiNx membrane overgrown by the film was performed using Talos TEM (ThermoFisher Scientific, Hillsboro, OR, USA) at 200 kV.
The scanning electron microscopy (SEM) was performed using the thermal field emission scanning electron microscope (FE SEM, model JSM-7000 F) manufactured by JEOL Ltd (Tokyo, Japan). FE SEM was linked to the EDS/INCA 350 (energy-dispersive X-ray analyzer) manufactured by Oxford Instruments Ltd. (Abingdon, UK).
Characterization of Bi/C Nanoparticles
at 120 kV. For imaging, the as-prepared samples were dispersed in
ethanol and supported on a TEM grid. These images verify the size,
morphology, and dispersion of the Bi/C NPs. High-resolution (HR)-TEM
images were taken from the samples before and after the electrocatalytic
experiments with a Titan 80-300 at 300 kV (Thermo Fisher Scientific).
Energy-dispersive X-ray analysis (EDX) elemental maps were acquired
using a 200 kV Talos TEM (Thermo Fisher Scientific).
Purification and Characterization of CPMV
Comprehensive Characterization of ZIF-8 Nanoparticles
Bacterial Vitrification for Cryo-TEM Imaging
Multimodal Characterization of Reduced Battery Electrodes
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