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Via raman spectrometer

Manufactured by Renishaw
Sourced in United Kingdom

The Via Raman spectrometer is a high-performance laboratory instrument designed for Raman spectroscopy analysis. It provides accurate and reliable measurements of the vibrational properties of materials. The spectrometer utilizes a laser source to excite the sample, and the resulting Raman shift is detected and analyzed to provide information about the molecular structure and composition of the material.

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4 protocols using via raman spectrometer

1

Raman Spectroscopy Analysis of Cell Cultures

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The Raman spectra were measured by a Renishaw in Via Raman spectrometer (controlled by WiRE 3.4 software, Renishaw, UK) connected to a Leica microscope (Leica DMLM, Leica Microsystems, Buffalo Grove, IL, USA), equipped with a 785 nm near-IR laser that was focused through a 63 × NA = 0.90 water immersion objective (Leica Microsystems, USA). The laser intensity before and after travelling through the 50× objective was 110 mW and 29.4 mW, respectively (measured with LaserCheck, Coherent Inc., Portland, OR, USA). The standard calibration peak for the spectrometer with silicon mode at a static spectrum was 520.5 ± 0.1 cm-1. Cells cultured with blank media, or media with G-CSF for 10 days and 7 weeks were seeded on MgF2 (United Crystals Co., Port Washington, NY, USA) for 24h prior to Raman spectra collection. The exposure time was 10 s for one accumulation at 100% laser power for all of the cell samples. A total of 50 spectra (randomly 5 spots for 5 spectra per cell) were acquired for each group in the fingerprint region (600 −1800 cm−1) which has been proven effective in evaluation of molecular changes of cancer cells 13 (link), 21 (link)–24 (link)
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2

Comprehensive Characterization of AWCs Materials

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The morphologies and structures of the AWCs materials were characterized by CuKa radiation (k = 1.5418). It was used for X-ray diffraction (XRD), which was carried out using a Rigaku D/Max-2400 diffractometer. Transmission electron microscopy (TEM, Japan), and scanning electron microscopy (FE-SEM, Germany). Raman spectra were obtained by a Via Raman spectrometer using an argon ion laser (Renishaw). X-ray photoelectron spectroscopy (XPS, Escalab 210 system, Germany). Atomic force microscope (AFM, NanoScope Analysis software, Digital instruments, United States). The Brunauer -Emmett-Teller (BET) surface area, before measuring nitrogen adsorption, all materials were degassed at 200°C., and the carbon samples’ pore structure was analyzed using nitrogen adsorption ASAP 2020 technology using Micromeritics’ (United States).
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3

Structural Characterization of HBFCs

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The structures and morphologies of the HBFCs samples were characterized by scanning electron microscopy (FE-SEM, Carl Zeiss Ultra Plus, and Germany) at an acceleration voltage of 5 kV, and the transmission electron microscopy (TEM, JEM-1200EX, Japan). X-ray diffraction (XRD) was conducted using a Rigaku D/Max-2400 diffractometer equipped with Cu Kα radiation (k = 1.5418 Å). Raman spectra were recorded through a Via Raman spectrometer (Renishaw) with an Argon ion laser (λ = 514.5 nm) at ambient temperature. The Brunauer–Emmett–Teller surface area (SBET) and pore structure of the carbon samples were analyzed by nitrogen adsorption in a Micromeritics ASAP 2020 nitrogen adsorption apparatus (U.S.A.), and all samples were degassed at 200 °C before nitrogen adsorption measurements. X-ray photoelectron spectroscopy (XPS) measurement was performed on an Escalab 210 system (Germany).
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4

Comprehensive Characterization of Prepared Materials

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Characterization of the prepared materials was carried out using Scanning Electron Microscope with Energy Dispersive Spectrometer (SEM-EDS) (Table A.2), Brunauer-Emmett-Teller (BET) analyzer, Raman spectroscopy and Fourier transform infrared spectroscopy (FTIR).
Raman shifts measurement was done using Renishaw in Via Raman spectrometer (Gloucestershire, UK) equipped with a 17 mW Renishaw Helium-Neon Laser 633 nm and CCD array detector at 50% laser intensity. Structural analysis was conducted using FTIR (Miracle-10: Shimadzu). The spectra were obtained at 4 cm -1 resolutions by measuring the absorbance from 400 to 4000 cm -1 using a combined 40 scans. The specific surface area and the porosity distributions were calculated using BET nitrogen adsorption-desorption isotherms and the Barrett-Joyner-Halenda (BJH) method, respectively by using a Micromeritics 3 FlexTM surface characterization analyzer at 77 K. Zeta potential was measured twice using 1.0 mM KCl solution at different pH for 48 h (Nano-ZS, Malvern). Zeta potential was measured twice for each pH.
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