In this study, Fourier transform infrared spectroscopy (FTIR) at attenuated total reflection (ATR) mode was employed to analyze the chemical structures and compositions of the liquid and cured UV-WA coating as well as the UV-WA/CNC. The FTIR-ATR spectra were obtained using a Vertex 80 Infrared Spectrometer manufactured by Bruker in Germany, which has a wavenumber range of 4000 cm−1 to 400 cm−1 and a resolution of 0.5 cm−1. The analysis of these spectra allowed for a detailed characterization of the molecular composition of the aforementioned materials.
The X-ray diffraction (XRD) patterns for both MCC and CNC were obtained using an Ultima IV X-ray diffractometer (Rigaku, Japan) with CNC powders that were oven-dried. The diffraction XRD spectra were scanned at a rate of 5° (2θ) min−1 within the range of 5° and 50° (2θ). The determination of the crystal structures for both MCC and CNC was based on the XRD patterns. All XRD patterns for MCC and CNC were analyzed using MDI Jade 6.5.
The X-ray diffraction (XRD) patterns for both MCC and CNC were obtained using an Ultima IV X-ray diffractometer (Rigaku, Japan) with CNC powders that were oven-dried. The diffraction XRD spectra were scanned at a rate of 5° (2θ) min−1 within the range of 5° and 50° (2θ). The determination of the crystal structures for both MCC and CNC was based on the XRD patterns. All XRD patterns for MCC and CNC were analyzed using MDI Jade 6.5.