The phase crystallinity of the prepared NPs was investigated using a X-ray diffractometer (model 3040XPert PRO, Philips) at 2θ degree in the range of 10–80°. The mean size of the crystallite was calculated applying Scherrer's formula. X-ray photoelectron spectra (XPS) were recorded using a Thermo-Scientific spectrophotometer (Thermo Scientific K-Alpha KA1066 spectrometer) equipped with an Al-Kα X-ray excitation radiation source with a beam-spot size of 300.0 μm. Besides this, field emission scanning electron microscopy (FESEM; JSM-7600F, JEOL, Japan) equipped with an EDS was used to investigate the elemental analysis and surface morphology of RuO2/ZnO/TiO2 NCs. Moreover, a Keithley electrometer (6517A, USA) was applied as the central dominating equipment to supply constant potential for the exploration of the electrochemical behavior of the proposed sensor. The band gap energy of the prepared NPs was determined by measuring the UV-vis diffuse reflectance spectra (UV-vis DRS) of the NPs under ambient conditions. The UV-vis DRS was recorded by scanning the samples from 200 to 800 nm using a UV-vis-NIR spectrometer (LAMDA 750, PerkinElmer, Inc, USA). Furthermore, Sintered PTFE was used as the standard reference.
K alpha ka1066 spectrometer
Manufactured by Thermo Fisher Scientific
Sourced in Germany
The K-Alpha KA1066 spectrometer is an analytical instrument used for X-ray photoelectron spectroscopy (XPS) analysis. It provides surface chemical information about solid samples. The spectrometer utilizes a monochromatic Al Kα X-ray source and is designed to measure the kinetic energy of photoelectrons emitted from the sample surface.
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3 protocols using k alpha ka1066 spectrometer
1
Characterization of RuO2/ZnO/TiO2 Nanocomposites
2
Comprehensive Material Characterization Protocol
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JEOL Scanning Electron Microscope (JSM-7600F, Japan) was used to analyze the morphology of the prepared material while the crystallography was studied by X'Pert Explorer, PANalytical X-ray diffractometer. The XPS spectrum was recorded in the range of 0 to 1350 eV by using a Thermo Scientific K-Alpha KA1066 spectrometer (Germany). For compositional, optical and degradation studies of the nanomaterial, FT-IR and UV spectrum were record by a PerkinElmer (spectrum 100) FT-IR spectrometer and PerkinElmer (Lambda 950) UV-visible spectrometer. For sensing study, I–V measurements were carried out using an electrometer (Kethley, USA).
3
Comprehensive Nanoparticle Characterization
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The surface morphology of the nanoparticles was studied using a EOL scanning electron microscope (JSM-7600F, Japan). Elemental analysis was carried out using EDS (Oxford). X-ray diffraction patterns (XRD) were taken with a computer-controlled X’Pert Explorer, PANalytical diffractometer. FT-IR spectra were recorded in the range of 400–4000 cm−1 on a Perkin Elmer (spectrum 100) FT-IR spectrometer. UV spectrum was recorded from 200 to 900 nm using UV-visible spectrophotometer (UV-2960, LABOMED INC.). An XPS survey scan was made by Thermo Scientific K-Alpha KA1066 spectrometer (Germany) in the range of 0–1350 eV.
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