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Quanta inspect f scanning electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Quanta Inspect F Scanning Electron Microscope is a versatile instrument designed for high-resolution imaging of a wide range of samples. It utilizes a focused electron beam to generate detailed topographical and compositional information about the surface of a specimen.

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6 protocols using quanta inspect f scanning electron microscope

1

Characterization of Cell-Seeded Microcages

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Following incubation in presence/absence of SMF, the cell culture media was removed and the cell‐seeded microcage‐like structures were gently washed three times using PBS. Afterwards, the cells were fixed during 1 h using 2.5% glutaraldehyde in PBS. After fixation, the cells were dehydrated using ethanol (Merck, Darmstadt, Germany) solutions of successive concentration (70%‐100%), followed by ethanol‐hexamethyldisilazane (Merck, Darmstadt, Germany) (50‐50, 25‐75, 0%‐100%). The cell‐seeded mirocage‐like structures were coated with 10 nm gold and the SEM analysis was performed using the FEI Quanta Inspect F Scanning Electron Microscope (Hillsboro, OR, United States).
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2

Surface Morphology and Elemental Analysis

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The Samples’ Surface Morphology and Elemental Composition were examined using a QUANTA INSPECT F Scanning Electron Microscope (FEI Company, Eindhoven, The Netherlands) coupled with an Energy-Dispersive X-Ray Spectrometer Detector (EDAX).
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3

Scanning Electron Microscopy of Dentin-Sealer Interface

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Three random specimens from each group were selected for SEM investigation (n = 12) and examined by a QUANTA INSPECT F Scanning Electron Microscope (FEI Company, Eindhoven, the Netherlands), working at an acceleration voltage of up to 30 kV and equipped with an energy-dispersive X-ray spectrometer detector (EDAX) with a 132 eV resolution at Mn-Kα. Specimens were dried, mounted on aluminum stubs, placed in sealed glass vials with silica, and sputter-coated with gold in a vacuum chamber. In order to analyze the dentin–sealer–core interface, serial SEM photomicrographs were taken at different magnifications (40× and 4000×). Two evaluations were performed for each photomicrograph.
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4

Characterization of SF/PEG Nanoparticles

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SF/PEG nanoparticles ((SF/PEG NPs) were visualized using a Quanta Inspect F Scanning Electron Microscope (FEI Company) equipped with a field emission gun with 1.2 nm resolution and an X-ray energy dispersive spectrometer (EDS) after coating with a thin layer of gold.
The size distribution of PEGylated silk fibroin nanoparticles in solution was evaluated by Dynamic Light Scattering (DLS) using a Malvern Zetasizer Nano (model ZEN5600, Malvern, UK). The same instrument was used for measuring of zeta-potential of SF/PEG NPs.
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5

Scanning Electron Microscopy of Polymeric Matrices

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A scanning electron microscope (SEM), the QUANTA INSPECT F Scanning Electron Microscope (FEI Company, Eindhoven, The Netherlands), equipped with an energy dispersive X-ray spectrometer detector (EDAX) (FEI Company, Eindhoven, The Netherlands) with a 132 eV resolution at MnKα, was used to obtain information about the inner morphology of the polymeric matrices and also to characterize the appearance of the surfaces. In order to perform the SEM analyses, the polymeric surfaces were covered with gold to lower the electronic charging effect.
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6

Visualizing BB Seed Structure

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The structure of BB seeds and of the BB seed powder before and after solvent extraction was visualized with a FEI Quanta Inspect F Scanning Electron Microscope (SEM). All samples were gold-coated prior to SEM examination.
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