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Sc7640 high resolution sputter coater

Manufactured by Quorum Technologies

The SC7640 High Resolution Sputter Coater is a laboratory instrument designed for the deposition of thin conductive films onto samples. It is capable of producing high-resolution coatings suitable for various analytical techniques, such as scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS).

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4 protocols using sc7640 high resolution sputter coater

1

Preparation and Imaging of Fractured Films

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After removal from
the solution, the films were frozen in liquid propane and lyophilized
for 2 days. The films were fractured and gold-coated using a SC7640
high-resolution sputter coater (QuorumTechnologies) for 30 s at 2.0
kV, and their cross sections were imaged using an FEI Quanta FEG 250
SEM.
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2

Scanning Electron Microscopy of Samples

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Scanning electron microscopy (SEM) observations were performed on a Phillips XL30 with a tungsten filament at a voltage of 25 kV. Previously, the samples were coated with Au in an SC7640 High-Resolution Sputter Coater (Quorum Technologies).
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3

Evaluating Hydrogel Microstructure via SEM

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The structures of EKGel and BME were studied using scanning electron microscopy (SEM). Supercritical point drying was utilized to prepare hydrogel samples. EKGel samples were allowed to gel overnight at 37 °C, fixed by submerging them in 2 wt % glutaraldehyde in HBSS for 24 h and washed with deionized water three times. Subsequently, the water was exchanged with ethanol by consecutively submerging the EKGel for 30 min in 30, 40, 50, 60, 70, 80, and 90 % (v/v) ethanol/water mixtures and then finally, in pure ethanol. Afterward, the hydrogels were placed in an Autosamdri-810 Tousimis critical point dryer. The ethanol in the sample was exchanged with liquid CO2, which was subsequently brought to a supercritical state and removed by slow venting. The dried EKGel was fractured and gold-coated using an SC7640 High Resolution Sputter Coater (Quorum Technologies). The samples were imaged on a Quanta FEI scanning electron microscope (10 kV).
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4

Structural Analysis of EKGel Hydrogel

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The structure of EKGel was studied by using SEM. Supercritical point drying was utilized to prepare hydrogel samples. EKGel samples were allowed to gel overnight at 37 °C and then were fixed by submerging them in 2 wt% glutaraldehyde in HBSS for 24 h and washed with deionized water three times. Subsequently, the water was exchanged with ethanol by consecutively submerging the EKGel for 30 min in 30, 50, 70, and 90 v/v% ethanol/water mixtures and then finally in anhydrous ethanol three times. Ethanol was then removed using an Autosamdri-810 Tousimis critical point dryer. The dried EKGel was then fractured. The samples were imaged on a Quanta FEI Scanning Electron Microscope (10 kV). For enhanced visualization, the samples were gold-coated using an SC7640 High Resolution Sputter Coater (Quorum Technologies). The analysis of fiber diameter was performed on EKGel samples without gold sputtering, as the fiber dimensions could be obscured by gold coating. Structural analysis was performed manually using ImageJ software. One EKGel sample was imaged for each C total . To avoid bias, the image analysis was conducted independently by two scientists. For each EKGel sample, 6 to 10 images of different regions were taken, and 10 to 20 fibers were analyzed in each image.
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