Mira 2
The MIRA II is a versatile scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features advanced electron optics and a high-performance electron gun to deliver exceptional image quality and resolution. The MIRA II is equipped with a range of analytical tools and detectors to enable comprehensive characterization of materials and structures.
Lab products found in correlation
15 protocols using mira 2
Comprehensive Characterization of Hierarchical Nanoflowers
Hydrogel Microstructure Analysis by SEM
Microstructure Analysis of Hydrogels
Scanning Electron Microscopy of S. aureus
Scanning Electron Microscopy Analysis
For other samples: The morphology and composition were examined by scanning emission microscopy on a Tescan MAIA 3 that was equipped with a field emission gun (Tescan Ltd., Brno, Czech Republic). Best images were obtained while using the external SE detector at working distance between 6.81–10.99 mm and at 5 kV acceleration voltage. The pixel images (768 × 858) were obtained at 1000 folds magnification covering a sample area of 208 µm. Full frame capture was performed in analytical mode and accumulation of image with image shift correction enabled, and it took about 1.5 min. with the 1 µs/pixel dwell time. Spot size was set at 17 nm.
Characterization of Mesoporous ZnO NPs
Characterization of Green-Synthesized CuO NPs
FE-SEM Morphological Characterization
Characterization of Nanocatalyst Materials
Characterization of Printed Ag Electrodes
The resistivity of electrodes printed on Si samples was measured by means of a semiconductor device analyzer Agilent B1500A (Keysight, Santa Rosa, CA, USA) in combination with a PM-5 probe station (CascadeMicrotech, Thiendorf, Germany). The measurements were carried out using a pseudo-Kelvin connection (two probes). The measurement range was from −2 to 2 V with a current limit of 30 mA.
The surface tension of Ag nano-ink deposited on the surface of the LiNbO3 samples was determined with a static method of a hanging drop by means of a ThetaLite optical tensiometer (Biolin Scientific, Espoo, Finland). It has been found that the surface tension of used Ag ink is equal to 39.8 × 10−3 N/m. The contact wetting angle of the sample surface was measured by the method of a sitting drop by means of recording the lateral profiles of the ink drops. These measurements were carried out for both rough and polished surfaces of the LiNbO3 samples.
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