The Fourier transform infrared spectra (FT-IR) was obtained by NICOLET380 FT-IR spectrometer (PerkinElmer, Waltham, MA, USA) using the KBr disk method. The absorption spectrum was performed on a UV-vis spectrophotometer (UV-3200PC) (Shanghai, China). The fluorescence spectrum was recorded by an FL spectrophotometer (Varian, Inc., Palo Alto, Santa Clara, CA, USA). The powder X-ray diffraction (XRD) pattern was obtained through graphite monochromatized Cu Kα radiation (D8ADVANCEDaVinci, Bruker, Shanghai, China). The Transmission electron microscope (TEM) image was recorded by the Tecnai G2 F30 S-Twin of Philips FEI from The Netherlands.
Tecnai g2 f30 s twin
Manufactured by Philips
Sourced in Netherlands
The Tecnai G2 F30 S-Twin is a high-performance transmission electron microscope (TEM) designed for advanced materials research and structural biology applications. The system offers a unique S-Twin lens configuration, providing enhanced image quality and resolution. It is capable of operating at accelerating voltages up to 300 kV, enabling the analysis of a wide range of samples at the nanoscale level.
Automatically generated - may contain errors
Lab products found in correlation
X pert pro diffractometer, by Malvern Panalytical (1 mentions)
Su8010 sem, by Hitachi (1 mentions)
Ht7700, by Hitachi (1 mentions)
Smartlab, by Rigaku (1 mentions)
Quanta inspect f, by Philips (1 mentions)
Uv 2550 system, by Shimadzu (1 mentions)
Nanoscope model multimode 8 scanning probe microscope, by Veeco (1 mentions)
S 4800, by Hitachi (1 mentions)
X pert pro, by Malvern Panalytical (1 mentions)
Asap 2460, by Micromeritics (1 mentions)
Labram hr800, by Horiba (1 mentions)
7 protocols using tecnai g2 f30 s twin
1
Characterization of Nanomaterials via Spectroscopy
2
Characterization of Nanomaterials via TEM, SEM, and XRD
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Transmission electron microscopy (TEM) images were taken on a Tecnai G2 F30 S-Twin (Philips-FEI, Netherlands) transmission electron microscope at acceleration voltage of 200 kV. The samples were dispersed in ethanol assisted by an ultrasonic technique. Scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) analysis were performed on a Hitachi-SU8010 SEM with acceleration voltage of 5 kV for imaging and 15 kV for EDS collection. The X-ray diffraction (XRD) patterns were recorded on an X'pert PRO diffractometer (PAN-alytical, Netherlands) using Cu Kα radiation at a generator voltage of 40 kV and tube current of 40 mA. The samples were scanned in the 2θ range of 10–80° with scanning speed of 0.02° s−1. Diffraction peaks were compared with the standard Joint Committee on Powder Diffraction Standards (JCPDS) database reported by the International Centre for Diffraction Data (ICDD). The adhesion of samples was evaluated using ultrasound tests by immersing the samples in water and applying ultrasound for 1 h. After the samples were dried at 110 °C for 2 h and calcined at 500 °C for 2 h, the weight loss was measured.
3
Characterization of Pd-Cu Nanomaterials
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The synthesized materials were treated to remove water by freeze drying at a temperature of −48 °C for over 24 h via a FD-1C-50 instrument (Beijing Boyikang Experimental Instrument Co., Ltd., Beijing, China). TEM studies were performed with a transmission electron microscopy (TEM, HT7700, Hitachi high technologies Corporation, Ibaraki, Japan). The structures of Pd-Cu nanomaterials were investigated via scanning electron microscope (SEM) Field Emission Gun FEI QUANTA FEG 250 (FEI Corporate, Hillsboro, OR, USA). X-ray diffraction (XRD) were obtained with an X-ray diffractometer equipped with a Bragg diffraction setup (SMART LAB, Rigaku, Akishima, Japan) and a Cu Kα X-ray radiation source to further characterize the obtained materials. High-resolution transmission electron microscopy (HRTEM, Tecnai-G2 F30 S-TWIN, Philips, Eindhoven, Netherlands) images were acquired with a JEM-2010 electron microscope (Hitachi, Tokyo, Japan) operated at 200 kV. X-ray photoelectron spectroscopy (XPS) was performed using a Bragg diffraction setup (ESCALAB 250Xi XPS) with Al Kα X-ray source.
4
Characterization of Gasoline Catalyst Waste
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A scanning electron microscope (SEM) Quanta Inspect F (FEI-Philips) working at an acceleration voltage up to 30 kV and equipped with energy dispersion X-rays spectrometer detector (EDAXR with a 132 eV resolution at Mn Kα) was used to determine surface morphology and elemental composition of different samples of a gasoline catalyst waste powder. SEM samples have been dispersed on a conducting amorphous carbon tape and attached to an aluminum holder.
A transmission electron microscope (TEM) model Tecnai G2 F30 S-Twin, (FEI-Philips) operated at an acceleration voltage of 300 keV and equipped with an X-ray energy dispersive spectroscopy (EDAXR System) was used to investigate the microstructure, composition and crystallographic phases of nanometric sized crystalline agglomerates obtained after the HDC processing of automotive waste powder. Preparation of the TEM samples involved an ultrasonic dispersion of the catalyst waste powder in ethanol, with one drop of the suspension placed after onto a copper grid covered with a holey amorphous carbon film.
A transmission electron microscope (TEM) model Tecnai G2 F30 S-Twin, (FEI-Philips) operated at an acceleration voltage of 300 keV and equipped with an X-ray energy dispersive spectroscopy (EDAXR System) was used to investigate the microstructure, composition and crystallographic phases of nanometric sized crystalline agglomerates obtained after the HDC processing of automotive waste powder. Preparation of the TEM samples involved an ultrasonic dispersion of the catalyst waste powder in ethanol, with one drop of the suspension placed after onto a copper grid covered with a holey amorphous carbon film.
5
Comprehensive Characterization of Composite Films
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The microstructure was characterized via transmission electron microscopy (TEM, HT7700, High-Technologies Corp., Ibaraki, Japan). High-resolution transmission electron microscopy (HRTEM, Tecnai-G2 F30 S-TWIN, Philips, Netherlands) were used to observe the morphologies and microstructures of the samples. Atomic force microscopy (AFM) measurements were carried out with a Nanoscope model Multimode 8 Scanning Probe Microscope (Veeco Instrument, Santa Barbara, CA, USA) to analyze the morphologies of the sample surface. The root-mean-square (rms) roughness of the obtained composite films was examined from the AFM images with a size of 10 × 10 μm2. FT-IR spectra was measured via a Fourier infrared spectroscopy (Thermo Nicolet Corporation, Madison, WI, USA) using the KBr tablet method. UV-vis spectra were obtained with a Shimadzu UV-2550 system (Shimadzu Corporation, Kyoto, Japan). Raman spectra for the experiment were measured by confocal micro-Raman spectrometer (inVia). The size distribution and zeta potential of present material was analyzed with the Nanozetasizer machine (ZEN 3690, Malvern Instruments, Malvern, UK). We obtained X-ray photoelectron spectroscopy (XPS) data by monitoring a Thermo Scientific ESCALab 250Xi (Netzsch Instruments Manufacturing Co., Ltd., Seligenstadt, Germany) equipped with 200 W of monochromatic AlKα radiation.
6
Characterizing L18FN Nanoparticles by FE-TEM
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The size and morphology of the L18FNs were observed by FE-TEM (Tecnai G2 F30 S-Twin, Philips-FEI Corp., Best, Netherlands). Samples were stained with 2% PTA solution. Then, a drop of each sample was placed on a TEM copper grid and dried in an oven at 37°C for 24 h.
7
Advanced Characterization of Nanomaterials
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X-ray diffraction (XRD) data were collected using an X’Pert PRO (PANalytical, Almelo, Netherlands, Cu Kα radiation, λ = 1.5418 Å). Raman and infrared (IR) spectra were recorded on LabRAM HR800 (Horiba JobinYvon, 632.81 nm excitation laser) and Thermo Nicolet Corporation Nicolet 6700, respectively. X-ray photoelectron spectroscopy (XPS) analysis was performed on Kratos AXIS Ultra DLD with Al Kα radiation (45 W). Scanning electron microscope (SEM) and energy dispersive spectrometer (EDS) mapping were carried out on S-4800 (HITACHI, Tokyo, Japan), and transmission electron microscope (TEM) was performed on Tecnai G2 F30 S-Twin (Philips-FEI, Amsterdam, Netherlands). The contact angle was tested on an OCA-20 system (DataPhyisics Instruments GmbH). Nitrogen adsorption/desorption isotherms were recorded on ASAP 2460 (Micromeritics). Before measurements, the sample was degassed under vacuum for 12 h at 180 °C. The Brunauer–Emmett–Teller (BET) model and Density Functional Theory (DFT) method were utilized to obtain values of the specific surface area and curves of pore size distribution, respectively.
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