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Jsm 7800f field emission

Manufactured by JEOL

The JSM-7800F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of materials and applications. The JSM-7800F utilizes a field emission electron source to generate a focused electron beam, enabling high-resolution imaging with low accelerating voltages. The microscope is equipped with advanced detectors and analytical capabilities to perform various imaging and spectroscopic techniques.

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3 protocols using jsm 7800f field emission

1

Ultrastructural Analysis of Organ of Corti

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Dissected cochlea were fixed in 2.5% glutaraldehyde, 0.1 M sodium cacodylate, 2 mM CaCl2 overnight at 4°C and then decalcified in 170 mM EDTA in PBS for 16 h at 4°C. Dissected organ of Corti was incubated in 2% each of arginine, glutamine, glycine, and sucrose in water overnight at RT, followed by incubation in 2% tannic acid and guanidine hydrochloride for 2 h at RT and 1% OsO4 in water for 1 h at RT, with extensive water washes between steps. The samples were transitioned to 100% ethanol, critical point dried from CO2 and sputter coating with gold. Samples were imaged using a JEOL JSM-7800F field emission scanning electron microscope.
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2

Comprehensive Characterization of Materials

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X-ray diffraction patterns (XRD) were obtained from a PANalytical X’pert MPD Pro diffractometer using Ni-filtered Cu Kα irradiation. The morphology and elemental analysis were studied using a JEOL JSM-7800F field emission scanning electron microscope (SEM) combined with an energy dispersive spectroscopy (EDS) detector. Transmission electron microscopy (TEM) images were obtained using JEOL JEM-2100Plus. Fourier transform infrared (FTIR) spectroscopy was recorded using KBr pellets on a Bruker Vertex 70 FTIR spectrometer in the wavenumber range of 400-4000 cm-1. The thermogravimetric analysis (TGA 209 F1) tests were carried out under Ar atmosphere at a ramp rate of 10 °C min-1. X-ray Photoelectron Spectroscopy (Thermo Fisher ESCALAB) analysis was used to determine their chemical compositions. The in-situ Raman measurement was conducted in the wavenumber range of 700-2300 cm-1 using a DXR Raman microscope (excitation length: 532 nm) with real-time CV at 0 to 1.2 V (vs. Ag/AgCl) and a 10 s exposure length.
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3

Characterization of PCVO Nanodiamonds

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The crystalline characteristic of as-prepared samples was identified by X-ray diffractometer (XRD, Rigaku MiniFlexll) with Cu Kα radiation (λ = 0.15406 nm) at a scanning angle (2θ) range of 10° to 90°. X-ray photoelectron spectra (XPS, Thermo Scientific K-Alpha) measurements were performed using an Al Kα X-ray source. Nitrogen adsorption–desorption isotherms were conducted by a Quantachrome instruments Autosorb-IQ3 system. The morphology and surface details of PCVO ND were analyzed by scanning electron microscopy (SEM, JEOL JSM-7800F Field Emission) and transmission electron microscopy (TEM, JEOL JEM, 1011).
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