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Micro cantilever

Manufactured by Olympus
Sourced in Japan

The Micro Cantilever is a precision laboratory instrument designed for highly sensitive force measurements. It features a small, flexible beam that can detect minute changes in force, making it a valuable tool for various scientific applications.

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4 protocols using micro cantilever

1

Atomic Force Microscopy Imaging Protocol

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AFM images were obtained using micro cantilever (OLYMPUS, Tokyo, Japan) and the dynamic force mode with Probestation NanoNavi II/IIe (Hitachi High-Tech Science, Tokyo, Japan). Five to twenty microliters of a sample were loaded to a mica plate, left for one minute, and then rinsed using 200 μL of water. The sweep rate was set to 0.5 or 1.0 Hz.
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2

Antioxidant Monolayer Formation by C14

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Langmuir-Blodgett studies was carried out for compound C14, being the ultimate compound with both surface active and antioxidant properties, according to the method of Correa et al.29 (link) with slight modications. Experiments were performed in aqueous solutions at neutral pH. Briefly, 20 µl of 2 mg/mL solution of C14 in chloroform:methanol (9:1, v/v) was applied to the aqueous phase and allowed to evaporate for a period of 20 min. Thereafter, the barriers were compressed at a constant rate of ~9 Å/ (chain min) until film collapsed. After stable conditions were attained, deposition of the corresponding film was carried out onto a hydrophilic mica support at a pressure just before film collapsed. The deposited monolayers on mica were left to air dry overnight. AFM images were acquired at ambient conditions by air tapping mode using a silicon tip on a micro cantilever (Olympus Inc., Japan) with a spring constant of 26 N/m and resonant frequency of 300 kHz. All measurements were performed in the center of the sample. Analyses were done in duplicates.
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3

Real-time Monitoring of DNA Origami Self-assembly

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The ring motif and its self-assembly were monitored by high speed atomic force microscopy (AFM) (Nano Live Vision, RIBM, Kyoto, Japan) with Micro Cantilevers (Olympus, Tokyo, Japan). Each measurement was performed in a liquid cell in an observation buffer (5 mM Tris, 1 mM EDTA, and 12.5 or 17.5 mM MgCl2). The concentration of the motif was constantly maintained at 1 nM. The substrate for AFM observation was a freshly cleaved mica (Furuuchi Chemical Corporation, Tokyo, Japan). Images were recorded with 1500 × 1125 nm2 scan size. The observation was conducted about 10 min after injection of the unpurified DNA origami solution. The images were analyzed using ImageJ open-source software.
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4

Wrinkle Pattern Analysis and Characterization

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Static wrinkle patterns were recorded with a 3D laser scanning confocal microscope (VK-X1000, KEYENCE). The dynamic wrinkle pattern elimination/reappearance process was recorded with a profile measurement microscope (VF-7501, KEYENCE). The Young's modulus of the top film was measured by atomic force microscopy nanomechanical mapping (Dimension Icon & FastScan Bio, Bruker), where the oscillation frequency of the Z-piezo was 1.0 kHz and the peak force amplitude was set at 150 nm. The samples were scanned using Olympus microcantilevers with a spring constant of 3 N/m. The NIR light was produced by a laser diode controller (λ = 808 nm; LE-LS-808-1000TFCB, LEO Photonics). 1H NMR spectra were measured on a Varian Mercury Plus spectrometer (400 MHz) with deuterated chloroform (CDCl3) as the solvent and tetramethylsilane as an internal standard at room temperature.
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