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Multimode nanoscopeiiia

Manufactured by Bruker
Sourced in United States

The Multimode NanoscopeIIIa is a high-resolution scanning probe microscope capable of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques. It provides nanometer-scale imaging and characterization of a wide range of materials and surfaces.

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9 protocols using multimode nanoscopeiiia

1

Graphite Surface Preparation for STM

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To prepare the sample for STM imaging, the substrate, HOPG (highly oriented pyrolytic graphite, Bruker, ZYB-grade), was pre-modified with a porous monolayer of TMA (trimesic acid, Sigma-Aldrich, 98%). Detailed preparation and characterization of the TMA adlayer are reported elsewhere.33 (link) Briefly, TMA was dissolved in PO (1-phenyloctane, TCI, 98%). After dropcasting of a 2.0 μL aliquot of saturated TMA on HOPG, the excess solvent was removed by using a piece of Kimwipes placed against the edge of the HOPG. A trace amount of scaffold 27 was dissolved in acetonitrile (aencore, >99.9%) and a 2.0 μL aliquot was placed on the TMA-modified HOPG. After most of the acetonitrile was evaporated, PO (<1 μL) was added on HOPG, and STM images were acquired by using a MultiMode NanoScopeIIIa (Bruker). The STM tips were home-made mechanically cut Pt/Ir wires (80%/20%, diameter 0.25 mm, California Fine Wires).
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2

Imaging N-BAR Proteins via AFM

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We
imaged the samples in contact mode at
ambient temperature using a Multimode Nanoscope IIIA scanning probe
microscope (Bruker, Santa Barbara, CA) with a Type J scanner. We used
a probe composed of the Si-nitride lever (200 μm long, 0.05
N/m spring constant) with a sharpened Si tip (HYDRA-All, AppNano),
which gave the best resolution for our sample. The tips were decontaminated
by ultraviolet-generated ozone before sampling (PSD-UV Surface Decontamination
System, Novascan, Ames, IA). An amplitude set point of 0 V was used
during imaging to minimize the contact forces and hence film damage.
Micrographs were obtained at a scan rate of 1.0 Hz at a resolution
of 512 pixels per line.
To image the proteins, we displaced
the content of the chamber with the protein solution (dissolved in
the experimental buffer at 75 nM per N-BAR dimer). We started imaging
immediately thereafter and continued imaging for ∼30 min.
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3

Surface Morphology Analysis of NaCas with Chlorophylls

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The surface morphology of NaCas with or without chlorophylls was tested using an AFM (Multimode NanoscopeIIIa, Bruker). Briefly, NaCas, NaCas with 1% (w/w) chlorophylls (L-NaCas) and NaCas with 3% (w/w) chlorophylls (H-NaCas) were diluted to solute concentration of 0.002% (w/w) NaCas. Ten microliters of the diluted samples were spread evenly on a 1.8 cm2 freshly-cleaved mica sheet and dried in a fume hood at ambient temperature (25 °C) overnight.21 (link) The microscope was operated in the tapping mode for all samples at a frequency of 50 to 100 kHz. The images were processed and analysed using Nanoscope Analysis, version 1.80.
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4

Atomic Force Microscopy of JC-PS1

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An AFM (Multimode NanoscopeIIIa, Bruker Corporation, Germany) was used to identify the surface topography of JC-PS1. In brief, JC-PS1 was diluted in distilled water to the final concentration of 10 μg/mL. 200 μL of the sample was dropped onto the freshly cleaved mica and dried under the infrared lamp before imaging. In addition, the AFM image was conducted by the Nanoscope software.
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5

Characterizing LaAlO3 Substrate Morphologies

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Scanning probe microscopy (SPM) (Bruker, Multimode Nanoscope IIIa) and a commercial probe NSG 10 (NT-MDT) with a force constant of 20–80 Nm were employed to characterize the morphologies of the annealed LaAlO3 substrates. X-ray diffraction (XRD) including normal (χ = 0°) and tilted (χ = 45°) θ–2θ scanning, ϕ-scanning and reciprocal space mapping were conducted using a Bede D1 XRD system with Cu Kα radiation (λ = 1.54060 Å).
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6

ETFE Film Irradiation and Characterization

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A 2 MeV accelerator (GJ-2, Shanghai Xianfeng Electric Machinery Plant) was used to irradiate ETFE films. The structure and morphology of ungrafted and grafted membranes were characterized by FT-IR spectroscopy (IR200, Nicolit) and AFM (Multimode NanoscopeIIIa, Bruker), respectively. The pH value of the solution was determined with a pH meter (Seven compact™, Mettler Toledo Co., Ltd.).
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7

AFM Topography of Decellularized Grass

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Atomic force microscopy (AFM) was utilized to determine the topography of lyophilized samples of decellularized grass in ambient air.
AFM experiments were performed in tapping mode on a Bruker Multimode Nanoscope IIIA AFM machine with a NuNano Scout 70 silicon probe (spring constant of 2 N/m and resonant frequency of 70 kHz). Gwyddion software was used to analyse the AFM images and generate the overlay 3D images of the topography.
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8

Atomic Force Microscopy Imaging Protocol

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All AFM images were obtained using a Bruker Multimode/ Nanoscope IIIa (Bruker, Santa Barbara, Ca, USA) in air at room temperature using a J-scanner or E-scanner with an x-y range of B160 mm and B15 mm respectively. All imaging was carried out in tapping mode using Bruker RTESPA cantilevers with a nominal resonant frequency of 300 kHz, a nominal spring constant of 40 N m À1 , and a nominal tip radius of 8 nm. The amplitude set point was kept at approximately 0.6 for all of the imaging. The scans varied in size depending on the sample from 2 mm 2 to 150 mm 2 . The scans were carried out at a frequency of approximately 0.25 Hz. All analysis of the AFM images was carried out using Gwyddion (http://gwyddion.net/) freeware. 41
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9

Nanoscale Polymer Imaging via AFM

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AFM was used to image the polymer formation on the graphite surface at the nanoscale. A Bruker Multimode/Nanoscope IIIa (Bruker, Santa Barbara, Ca, USA) was used for all imaging. To improve image resolution, two scanners were used: a J-scanner and an E-scanner with x-y ranges of ∼160 µm and ∼15 µm, respectively. All experiments were carried out using tapping mode in air at ambient conditions. For all experiments, Bruker RTESPA cantilevers were used with a nominal resonant frequency of 300 kHz, a nominal spring constant of 40 N/m, and a nominal tip radius of 8 nm. The freeware Gwyddion (http://gwyddion.net/) was used for all image processing and analysis. 41
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