Multimode nanoscopeiiia
The Multimode NanoscopeIIIa is a high-resolution scanning probe microscope capable of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques. It provides nanometer-scale imaging and characterization of a wide range of materials and surfaces.
Lab products found in correlation
9 protocols using multimode nanoscopeiiia
Graphite Surface Preparation for STM
Imaging N-BAR Proteins via AFM
imaged the samples in contact mode at
ambient temperature using a Multimode Nanoscope IIIA scanning probe
microscope (Bruker, Santa Barbara, CA) with a Type J scanner. We used
a probe composed of the Si-nitride lever (200 μm long, 0.05
N/m spring constant) with a sharpened Si tip (HYDRA-All, AppNano),
which gave the best resolution for our sample. The tips were decontaminated
by ultraviolet-generated ozone before sampling (PSD-UV Surface Decontamination
System, Novascan, Ames, IA). An amplitude set point of 0 V was used
during imaging to minimize the contact forces and hence film damage.
Micrographs were obtained at a scan rate of 1.0 Hz at a resolution
of 512 pixels per line.
To image the proteins, we displaced
the content of the chamber with the protein solution (dissolved in
the experimental buffer at 75 nM per N-BAR dimer). We started imaging
immediately thereafter and continued imaging for ∼30 min.
Surface Morphology Analysis of NaCas with Chlorophylls
Atomic Force Microscopy of JC-PS1
Characterizing LaAlO3 Substrate Morphologies
ETFE Film Irradiation and Characterization
AFM Topography of Decellularized Grass
AFM experiments were performed in tapping mode on a Bruker Multimode Nanoscope IIIA AFM machine with a NuNano Scout 70 silicon probe (spring constant of 2 N/m and resonant frequency of 70 kHz). Gwyddion software was used to analyse the AFM images and generate the overlay 3D images of the topography.
Atomic Force Microscopy Imaging Protocol
Nanoscale Polymer Imaging via AFM
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