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Omcl ac240ts r3

Manufactured by Olympus
Sourced in Japan

The OMCL-AC240TS-R3 is a high-performance spectrophotometer designed for laboratory use. It features a wavelength range of 190-1100 nm and a spectral bandwidth of 1 nm. The instrument has a photometric range of -4 to 4 Abs and a photometric accuracy of ±0.002 Abs. It is equipped with a Xenon lamp and a CCD detector.

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8 protocols using omcl ac240ts r3

1

Nanomechanical Properties of Spin-Cast PSx(NH3+Cl-) Films

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A spin-cast film (300-nm thick) of PSx(NH3+Cl) was prepared, and a topographical image was obtained in a 10 × 10 µm2 area using a MFP-3D Origin AFM (Asylum Research, Oxford Instruments) under a N2 atmosphere (RH < 5%). Force curves obtained by indentation-retraction cycles were measured 10 × 10 (100) times in the image at a lateral scanning speed of nm s−1. The cantilever was OMCL-AC240TS-R3 (Olympus; Al-coated silicon, tip radius: 7 nm, force constant: 2 N m−1, Frequency: 70 kHz). The spring constant was calibrated in the measurement for a mica surface. By analyzing the retraction process of the cantilever with the JKR model, the elastic modulus was determined.
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2

Measuring Tungsten Surface Roughness

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The roughness of the tungsten sheets was measured by atomic force microscopy (Supplementary Fig. 2). The RMS roughness is 15 nm and the maximum roughness scale is 195 nm, measured over 300 µm2. The measurements were made in tapping mode using a JPK Nanowizard atomic force microscope in air mounted with an Olympus silicon cantilever (model OMCL-AC240TS-R3, 70 kHz frequency, 2N/m stiffness). The size of pits on the surface were determined by SEM images and image analysis by ImageJ.
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3

Characterization of sCA Nanoparticles

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The distribution of particle size was measured using Fiber-Optical Dynamic Light-Scattering Spectrophotometer FDLS-3000 (Otsuka Electronics, Osaka, Japan) equipped with a 532 nm diode laser. The measurement was carried out by a scattering angle of 90° at 25°C. Size distributions were determined by cumulant and histogram analysis of DLS data using the software provided by the manufacturer. The morphology and size distribution of the sCA nanoparticles was further analyzed by laser microscope (OLS-4100, Shimadzu) and atomic force microscopy using a scanning probe microscope (SPM-9500, Shimadzu) in dynamic mode and equipped with a microcantilever (OMCL-AC240TS-R3, Olympus). Optical density (OD) of the samples at 655 nm was measured spectrophotometrically at different pH using a microplate reader (680 XR, Bio-Rad). The zeta potential of the particles was measured by Laser Doppler Micro-electrophoresis (Zetasizer Nano Z, Malvern) at 25°C for 30 sec.
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4

Cryomicrotomy and AFM Characterization of SR-SPEs

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The bulk structure of the SR-SPEs was exposed by cutting with a cryomicrotome EM FC7 (Leica, Germany). The phase image of the cut surface of the SR-SPE was observed by AFM (Cypher ES, Oxford Instruments) in AC mode using a cantilever probe (OMCL-AC240TS-R3, Olympus) with a spring constant of 3.01 N m -1 and a resonance frequency of 76.9 kHz. The measurement was conducted in air at 25°C. The obtained data were visualized using Asylum Research software.
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5

Characterization of Nanoparticle Deposition

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The electronic property of deposition is measured by Keithley 2400 with probe station. Silver glue (EPO-TEK H20E) is used for electrode as contact between deposition and probes. The elemental constitutent of deposition is measured by energy-dispersive X-ray spectroscopy (EDAX. Inc.). The nanoindentation was performed under Veeco diDimension icon AFM. The AFM probe is OMCL-AC240TS-R3 with 2 N/m spring constant from Olympus. Measurement involving NV centres (remanent field of nickel pads Fig. 3g–i, microwave waveguide Fig. 4f–g) were performed by a home-made confocal microscope setup that contains a 520 nm laser (PL520, Thorlabs), a 100 × 0.95 NA air objective lens (Olympus), a 3D piezo nanopositioner (Physik Instrumente GmbH), a 650 nm longpass filter (DMLP650) and an avalanche photodiode (Excelitas Technologies Inc.).
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6

Visualizing Cells and Filaments using AFM

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To visualize cells, 10 μl of buffer solution containing cell samples were deposited on mica. The excess buffer was absorbed with filter paper. The sample was air-dried and was mounted on a metal puck (Oxford Instrument). To visualize individual filaments, 5 μl of buffer solution containing filaments were deposited on a silicon wafer insulated by a 300-nm silicon dioxide dielectric layer with gold electrodes patterned by e-beam as previously described2 (link). Atomic force microscopy (AFM) experiments were performed using soft cantilevers (OMCL-AC240TS-R3, OLYMPUS) with a nominal force constant of 2 Nm−1 and resonance frequencies of 70 kHz. The free-air amplitude of the tip was calibrated with the Asylum Research software and the spring constant was captured by the thermal vibration method. The sample was imaged with a Cypher ES scanner using intermittent tapping (AC-air topography) mode. AFM showed that gold electrodes were bridged with individual filaments to facilitate conductivity measurements (Extended Data Fig. 7g). All AFM image analyses for cells and filaments were performed using Gwyddion49 . The AFM height cross section has been analysed using IGOR Pro software (WaveMetrics).
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7

Size Analysis of CA Nanoparticles

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The size distributions of CA nanoparticles and CA-CpG were analyzed with a Zetasizer Nano ZS (Malvern Instruments, Malvern, Worcestershire, UK). Specifically, the mean diameters and particle size distributions of the nanoparticles in mouse serum albumin (Sigma-Aldrich) were measured by means of a dynamic light-scattering method using capillary cells. The size distributions of both types of nanoparticles were also analyzed by atomic force microscopy conducted with a scanning probe microscope (SPM-9500, Shimadzu, Kyoto, Japan) operated in dynamic mode and equipped with a microcantilever (OMCL-AC240TS-R3, Olympus, Tokyo, Japan).
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8

Morphological Analysis of CA-[Glc] Complex

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The morphology and size distribution of the CA-[Glc] complex was analysed using a scanning probe microscope (SPM-9500, Shimadzu) in dynamic mode, equipped with a microcantilever (OMCL-AC240TS-R3, Olympus). All samples were air dried for 5 min and analysed on freshly cleaved mica substrate.
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