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Jcm 6000 plus scanning electron microscope

Manufactured by JEOL
Sourced in Japan

The JCM-6000 Plus is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging of samples at the microscopic level. The core function of the JCM-6000 Plus is to generate and focus an electron beam to scan the surface of a sample, producing detailed images that reveal the sample's topography and composition.

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2 protocols using jcm 6000 plus scanning electron microscope

1

Characterization of rGO and rGO@ZnO Catalysts

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The following
techniques were used to characterize the rGO and rGO@ZnO nanocomposite
catalysts. Thermal degradation was carried out using Shimazdu TGA-50.
A Rigaku (Tokyo, Japan) Smart Lab X-ray diffractometer (XRD) with
Cu-Kα radiation (λ = 1.5406 Å) was
used to determine the crystalline nature and to confirm the phase.
The Fourier transform infrared spectroscopy (FTIR) measurements were
performed in the 4000–400 cm–1 range with
a KBr pellet method on a Bruker Vertex 70 (Germany) at room temperature.
A Quantachrome Nova 2200E-BET (surface area analyzer) was used to
determine the pore size distribution and surface area. A JEOL (Tokyo,
Japan)-JCM-6000 Plus scanning electron microscope (SEM) and JEOL-JEM-2100
transmission electron microscope (TEM) were utilized to observe the
morphological features, particle size, and structural parameters of
β-SnWO4 nanoparticles. A JEOL-JED-2200 series energy dispersive
X-ray spectrometer (EDX) was utilized for elemental composition determination
of the prepared samples at room temperature.
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2

Characterization of Hydrogel Microstructures

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Bemcot (10 mg) was incubated at 37°C for 24 h in the absence and presence of AkEG21 (0.1 mg) in 0.5 mL of 50 mM sodium acetate buffer (pH 5.5). Then, aliquots were analyzed by SEM. To characterize the hydrogel microstructures, the samples were freeze-dried and cut into small squares and coated with Pt/Pd using a sputter coater (E-1010, Hitachi, Tokyo, Japan). The samples were observed by Scanning electron microscopy (JCM6000-plus scanning electron microscope, JEOL Ltd., Tokyo, Japan) under an accelerating voltage of 1.5 kV.
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