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Jms 700 electron

Manufactured by JEOL

The JMS-700 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a tungsten electron source, a high-performance electron optical column, and advanced imaging and analytical capabilities.

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2 protocols using jms 700 electron

1

Spectroscopic and HPLC Analysis of Compounds

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Nuclear magnetic resonance spectra were obtained with a Bruker DRX-300 spectrometer operating at 300 MHz and with Agilent DD2 600 MHz NMR Spectrometer operating at 600 MHz, with chemical shifts reported in parts per million (ppm, δ) downfield from TMS, an internal standard. High-resolution mass spectra (HRMS) were measured with a JEOL (JMS-700) electron impact (EI) mass spectrometer. Purity of the final compounds was determined using a Hitachi 2000 series HPLC system using C-18 column (Agilent ZORBAX Eclipse XDB-C18 5 μm. 4.6 mm × 150 mm) and was found to be ≥95% in all cases. Flash column chromatography was carried out using silica gel (Merck Kieselgel 60, no. 9385, 230–400 mesh ASTM). All reactions were done under an atmosphere of dry nitrogen.
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2

Spectroscopic Analysis of Organic Compounds

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Chemistry Nuclear magnetic resonance (1H NMR and 13C NMR) spectra were obtained with a
Bruker DRX-500 spectrometer operating at 300 MHz. Chemical shifts
are reported in parts per million (ppm, δ) downfield from TMS
as an internal standard. High-resolution mass spectra (HRMS) were
measured with a JEOL (JMS-700) electron impact (EI) mass spectrometer.
The purity of the final compounds was determined using a Hitachi 2000
series HPLC system using C-18 column (Agilent ZORBAX Eclipse XDB-C18
5 mm. 4.6 mm 150 mm) and all compounds are >95% pure by HPLC analysis.
Column chromatography was accomplished on silica gel (Merck Kieselgel
60, No. 9385, 230e400 mesh ASTM). All reactions were carried out under
an atmosphere of dry nitrogen.
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