Jms 700 electron
The JMS-700 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a tungsten electron source, a high-performance electron optical column, and advanced imaging and analytical capabilities.
Lab products found in correlation
2 protocols using jms 700 electron
Spectroscopic and HPLC Analysis of Compounds
Spectroscopic Analysis of Organic Compounds
Bruker DRX-500 spectrometer operating at 300 MHz. Chemical shifts
are reported in parts per million (ppm, δ) downfield from TMS
as an internal standard. High-resolution mass spectra (HRMS) were
measured with a JEOL (JMS-700) electron impact (EI) mass spectrometer.
The purity of the final compounds was determined using a Hitachi 2000
series HPLC system using C-18 column (Agilent ZORBAX Eclipse XDB-C18
5 mm. 4.6 mm 150 mm) and all compounds are >95% pure by HPLC analysis.
Column chromatography was accomplished on silica gel (Merck Kieselgel
60, No. 9385, 230e400 mesh ASTM). All reactions were carried out under
an atmosphere of dry nitrogen.
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