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Su8100 cold field emission scanning electron microscope

Manufactured by Hitachi
Sourced in Japan

The SU8100 is a cold field emission scanning electron microscope (SEM) manufactured by Hitachi. The SU8100 is designed to provide high-resolution imaging of samples by utilizing a cold field emission electron source, which generates a stable and bright electron beam. The core function of the SU8100 is to enable high-resolution imaging and analysis of a wide range of materials and samples.

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2 protocols using su8100 cold field emission scanning electron microscope

1

Microstructural analysis of fermented dough

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Following fermentation, a small piece of the dough was immediately fixed by immersion in a 2.5% glutaraldehyde solution, and the dough was then dehydrated with an ethanol gradient. After freeze-drying for 48h, the dough was fixed on an aluminium holder using conductive adhesive and coated with a thin layer of gold. The microstructure of the dough was observed using an SU8100 cold field emission scanning electron microscope (Hitachi, Ltd., Tokyo, Japan) at an acceleration voltage of 3 kV and a magnification of 1000×.
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2

Ultrastructural Analysis of UDEP and SUDEP

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UDEP and SUDEP were cut into cubes (0.5 cm3) and mixed, respectively, with glutaraldehyde overnight (>12 h). After decanting the glutaraldehyde, the samples were washed with 0.05 M PBS buffer (pH 7.2) for 15 min and dehydrated in a gradient series of ethanol (70 %, 80 %, 90 %, and 100 %) for 30 min. Subsequently, the samples were pre-treatment in the −80 °C ultra-low temperature freezer and and later vacuum freeze-dried via a SCIENTZ-10 N vacuum freeze dryer (Ningbo ScientzBiotechnology Co., ltd., Ningbo, China). The freeze-dried samples were coated with gold dust and analyzed using a SU8100 cold-field-emission scanning electron microscope (Hitachi) in low-vacuum mode at 2,500 × magnification [16] .
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