Su8100 cold field emission scanning electron microscope
The SU8100 is a cold field emission scanning electron microscope (SEM) manufactured by Hitachi. The SU8100 is designed to provide high-resolution imaging of samples by utilizing a cold field emission electron source, which generates a stable and bright electron beam. The core function of the SU8100 is to enable high-resolution imaging and analysis of a wide range of materials and samples.
Lab products found in correlation
2 protocols using su8100 cold field emission scanning electron microscope
Microstructural analysis of fermented dough
Ultrastructural Analysis of UDEP and SUDEP
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