Chemical composition of the fibres was assessed using energy-dispersive X-ray spectroscopy (EDX) and performed using INCA X-Sight (Oxford Instruments, Abingdon, UK). The voltage used was 20 kV and the working distance was 10 mm. INCA software (ETAS, Derby, UK) was used to analyse the EDX spectra.
Inspect f sem
The Inspect F SEM is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of surface structures and compositions. It provides detailed information about the morphology and elemental composition of samples at the nanoscale level. The core function of the Inspect F SEM is to enable users to perform advanced materials characterization and analysis in a wide range of applications.
Lab products found in correlation
6 protocols using inspect f sem
Fiber Morphology and Composition Analysis
Chemical composition of the fibres was assessed using energy-dispersive X-ray spectroscopy (EDX) and performed using INCA X-Sight (Oxford Instruments, Abingdon, UK). The voltage used was 20 kV and the working distance was 10 mm. INCA software (ETAS, Derby, UK) was used to analyse the EDX spectra.
Gold-Sputtered Composite Film Imaging
frozen fracture cross sections of composite films were gold-sputtered
and observed by an FEI Inspect F-SEM instrument with an acceleration
voltage of 20 kV.
Scanning Electron Microscopy Analysis
Comprehensive Material Characterization Protocol
structure analysis of all prepared samples was conducted using powder
X-ray diffraction (XRD) with Cu Kα (λ = 1.5406 Å)
radiation in the 2θ range from 10 to 80°. This characterization
was carried out by using a Rigaku XRD instrument from Japan. Furthermore,
the morphology of all of the samples was assessed using a field emission
scanning electron microscope (FE-SEM, FEI Inspect-F SEM). To determine
the content of transition-metal species within all samples after cycling,
X-ray photoelectron spectroscopy (XPS) was employed. This analysis
utilized Al Kα radiation and was performed by using the ULVAC-PHI
(Quantes) instrument. Data were collected and averaged from ten individual
cells. Microstructure analysis was conducted by using a high-resolution
transmission electron microscope (TEM, JEOL JEM-2100F). To safeguard
the integrity of the TiO2/Al2O3 coating
during sample preparation and subsequent processing, a protective
layer of platinum was applied. This protective layer was created through
an initial electron-beam deposition followed by ion-beam-assisted
deposition, employing an SEIKO SMI3050SE Dual-Beam Focused Ion Beam
(FIB) instrument. Following the application of a protective layer,
TEM specimens were carefully prepared using gallium-focused ion-beam
milling techniques.
Scanning Electron Microscopy of Creep Fracture
SEM Analysis of Demineralized Dentin Collagen
Four areas of each specimen were viewed at a range of magnifications between x1000 and x80000 viewing both the intra-and inter-tubular dentine. When measuring collagen fibre dimensions measurements were taken from 5 areas on 3 high magnification (80000x) images. Measurements were taken with ImageJ software version 1.46 (Open access, NIH, USA).
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