Areas of NV and Ven tissue on healthy and infected leaves were imaged using a SU5000 Schottky Field Emission Scanning Electron Microscope (Hitachi). Samples were imaged by being placed in a low-pressure mode (80 Pa), using an accelerating voltage of 10 kV, a working distance of 21–23 mm and at a tilt of between 51–53°.
Su5000 schottky field emission scanning electron microscope
Manufactured by Hitachi
Sourced in United States
The SU5000 Schottky Field Emission Scanning Electron Microscope is a high-performance imaging tool designed for advanced material analysis. It features a Schottky field emission gun that provides high-resolution imaging capabilities. The SU5000 is capable of producing detailed, high-quality images of a wide range of samples.
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4 protocols using su5000 schottky field emission scanning electron microscope
1
Imaging Leaf Tissue Structure
2
Scanning Electron Microscopy of Starch Granules
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Developing kernels were collected and fixed in FAA solution (3.7% formaldehyde, 5% glacial acetic acid, and 45% ethanol) at 4°C overnight. Kernels were dehydrated in an ethanol series and kept in 100% ethanol. Additional sample preparation and scanning EM observations were performed at Interdisciplinary Center for Biotechnology Research Electron Microscopy core at the University of Florida, Gainesville, FL. Scanning EM data were collected with a Hitachi SU5000 Schottky field emission scanning electron microscope. Starch granule diameter was measured using ImageJ for three scanning EM images from each genotype and developmental stage. For particle size analysis, mature endosperm tissue was dissected and ground into fine powder with a bead mill. Endosperm powder (0.1 g) was mixed with 1 ml of ethanol and vortexed immediately before measurement with a Beckman/Coulter LS 13 320 laser diffraction particle size analyzer.
3
Visualizing EV Morphology and Topology using FE-SEM
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Field emission-scanning electron microscopy (FE-SEM) was used for visualizing the bead morphology, topology, and EV sizes, pre- and post-EV capture. Pre-capture beads were washed 3x with ice-cold pH 4, 1x PBS, and resuspended in 25 uL washing buffer. Post-capture beads were washed 3x in ice-cold pH 8.0 1x PBS with 10 mM Tris and resuspended in 25 uL of releasing washing buffer. Each resuspension solution was gently mixed and then directly aliquoted onto a 100% acetone-cleaned Ted Pella aluminum pin stub mount with complete solution evaporation. Next, the samples were sputter-coated for 30 s with an Au/Pd target using a Denton Desk V Sputter Coater and loaded into a Hitachi SU5000 Schottky Field- Emission Scanning Electron Microscope at a high negative vacuum pressure of 10–8 torr. An incident electron beam was applied to the samples at 7 keV and a beam current of 16.7 nA. Aperture and stigmata corrections were done before sample images were obtained.
4
Probing Gelatin Nanoparticle Morphology by FE-SEM
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