Tristar 2 3020
The TriStar II 3020 is a surface area and porosity analyzer that uses gas adsorption techniques to measure the surface area and pore size distribution of solid materials. The instrument is capable of performing both single-point and multi-point surface area analysis, as well as pore size distribution analysis using the BJH (Barrett-Joyner-Halenda) method. The TriStar II 3020 is designed to provide accurate and reliable data for a wide range of materials, including catalysts, adsorbents, and porous solids.
Lab products found in correlation
20 protocols using tristar 2 3020
Microstructural Characterization of Materials
Characterizing Composite Materials Using Advanced Techniques
Comprehensive Characterization of APSW Material
X-ray photoelectron spectroscopy (XPS) analysis of the synthesized material was done using a Thermo Fisher photoelectron spectrometer fitted with a monochromatic Al Kα radiation X-ray source. A Zeiss Ultra-plus 55 field emission scanning electron microscope (FE-SEM), operated at 1.0 kV was used to characterize the surface morphologies of the samples. TEM measurements were obtained using a cold field-emission JEOL F200 TEM operating at 200 kV.
Surface Area and Pore Analysis
Comprehensive Characterization of MMO Powders
Characterization of Nano ZT and Nano ZT/Vit B12
Platinum-Doped Boron Carbide Catalysts
Specific Surface Area of Respirable Dust
Colloidal SBA-15 Characterization Protocol
Comprehensive Materials Characterization Protocol
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