X-ray diffraction of patterns was carried out on a PW1710 instrument with CuKα radiation (λ = 0.15406 nm). Fourier transform infrared spectroscopy (FTIR) spectra were obtained from a Bruker Vector-22 FTIR spectrometer at room temperature. The transmittance of the nacre-mimetic films was measured on UV-2501PC/2550 at room temperature (Shimadzu Corporation, Japan). Element content in the bulk artificial nacre was quantitatively analyzed by elemental analyzer (Vario EL cube, Elementar). The microstructure of the all the samples was observed by SEM (Zeiss Supra 40) at an acceleration voltage of 5 kV. The evolutions of the bulk artificial nacre and natural nacre under strong shock were captured by a high-speed video camera (FASTCAM SA5, Photron Limited). The dynamic crack extensions in the bulk artificial nacre and pure SA bulk under a three-point bending test were captured by digital microscope (B011, Shenzhen D&F co., LTD, China). Density of the bulk artificial nacre and natural nacre was determined from their total mass divided by their total volume.
Uv 2501pc 2550
Manufactured by Shimadzu
Sourced in Japan
The UV-2501PC/2550 is a UV-Visible spectrophotometer manufactured by Shimadzu. It is designed to measure the absorption or transmission of light in the ultraviolet and visible regions of the electromagnetic spectrum.
Automatically generated - may contain errors
Lab products found in correlation
Vector 22 ftir spectrometer, by Bruker (1 mentions)
Supra 40, by Zeiss (1 mentions)
Vario el cube, by Elementar (1 mentions)
Nicolet is10 infrared spectrometer, by Thermo Fisher Scientific (1 mentions)
X pert pro super x ray diffractometer, by Philips (1 mentions)
Jem arm200f, by JEOL (1 mentions)
X pert pro mrd x ray diffractometer, by Malvern Panalytical (1 mentions)
Sdt q600 thermogravimetric analyzer, by TA Instruments (1 mentions)
Vk x100, by Keyence (1 mentions)
4 protocols using uv 2501pc 2550
1
Characterization of Bioinspired Nacre Composites
2
Comprehensive Material Characterization Protocol
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Transmission electron microscopy (TEM) images were obtained on a JEOL-2010 transmission electron microscope operated at an acceleration voltage of 200 kV. X-ray powder diffraction (XRD) analysis was measured on a Philips X’Pert Pro Super X-ray diffractometer equipped with graphite-monochromatized Cu KR radiation in the 2θ range of 5–80°. The Fourier transform infrared spectroscopy (FT-IR) data was measured on a Thermo Scientific Nicolet iS10 infrared spectrometer. The X-ray photoelectron spectroscopy (XPS) data were measured on ESCALab MKII X-ray photoelectron spectrometer (VG Scientific, London, UK), using Mg KR radiation as the exciting source. The UV data was measured by using UV-2501PC/2550 (Shimadzu, Tokyo, Japan). The specific surface area was measured with a Quantumchrome ASIQ gas sorption analyzer by degassing the gas under vacuum at 120 °C for 12 h.
3
Characterization of Nanocomposite Aerogels
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SEM images were taken with a Carl Zeiss Supra 40 field emission scanning electron microscope (2–5 kV, depending on the sample state). All samples were measured in the form of aerogels that were prepared by freeze-drying of the purified wet nanocomposite pellicles. All aerogel samples were sputtered with gold for 30 s at a constant current of 30 mA before observation. Transmission electron microscopy (TEM) images were acquired using a JEOL JEM-ARM200F transmission electron microscope (200 kV). XRD data were measured by a PANalytical X'pert PRO MRD X-ray diffractometer equipped with Cu Kα radiation (λ = 1.54056 Å). The samples were tested in the form of films prepared by hot-pressing of the purified wet nanocomposite pellicles. UV–vis spectra were recorded on UV-2501PC/2550 at room temperature (Shimadzu Corporation, Japan). TGA data were measured in a nitrogen atmosphere with a TA Instruments SDT Q600 thermogravimetric analyzer. All the samples were tested in the form of films.
4
Laser-Induced Silver Nanowire Characterization
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Morphology of silver nanowire and micro/nanostructures induced by laser ablation for SPAMs were characterized by using a field‐emission scanning electron microscope (JSM‐6700F). The sliding angles of the water, NaCl solution, glycerol, and EG droplets were measured using a CA100C contact‐angle system (Innuo) at 10% humidity and 20 °C. The sheet resistance of SNW films was measured using a four‐point probe technique (RST‐9, Four‐Probe Technology). The surface temperatures of the SNWH and JR‐PISS were measured by a thermal infrared camera (VarioCAMhr head 680, InfraTec). Optical transparency evolution curves for JR‐PISSs were recorded by dynamic‐spectrum‐analysis mode of UV‐2501PC/2550 (Shimadzu Corporation, Japan). The near‐infrared light (FU808AD300‐BC/BD10, Fuzhe Technology Co., Ltd, China) with wavelength of 808 nm (0.3 W; spot area, 1.4×2.3 mm2) was used for the proof‐of‐concept of JR‐PISS serving as light shutter. All digital photos were shot by a mobile phone (iphone‐8 plus, 7 mega‐pixel). 3D images for in situ monitoring the profile evolution of JR‐PISS with respect to Joule‐heating times were captured by a 3D profile meter (VK‐X100, KEYENCE CORPORATION, Japan).
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