Irtracer 100 ftir spectrophotometer

The structures of SBA-15 support, ZnO/SBA-15, and Ru-ZnO/SBA-15 composites were investigated by Fourier-transform infrared (FT-IR). FT-IR spectra (4000–400 cm⁻¹) were measured in the Shimadzu IRTracer-100 FT-IR spectrophotometer (Kyoto, Japan). Small-angle X-ray diffraction (SA-XRD) and wide-angle X-ray diffraction (WA-XRD) modes were implemented for the structural analysis of the support and composites using a Bruker D8 Advance diffractometer (Karlsruhe, Germany; θ-θ type) with characteristic CuKα radiation (λ = 1.5418 nm) and graphite monochromator operated at 40 kV and 40 mA. X-ray diffraction (XRD) pattern for WAXS was measured in the 10 and 70° (2θ) range and scan speed of 0.1°/5 s, whereas the XRD pattern for SAXS was recorded in 2θ measurement range between 0 and 10° and a scan speed of 0.1°/5 s. Diffracplus Basic software and the PDF-ICDD 2-2008 database were used for phase identification, while quantitative analysis was carried out with the Diffracplus TOPAS 4.1 software (Karlsruhe, Germany). FT-IR spectra (4000–400 cm⁻¹) were recorded as KBr pellets in a Shimadzu IR affinity-1 spectrophotometer.

The FTIR analysis (ASTM E168, E1252) using an IRTracer-100 FTIR spectrophotometer (Shimadzu, Kyoto, Japan) was used for identifying samples by their ability to absorb infrared light at different frequencies to produce a unique “spectral fingerprint”. The DPR biomass, PLA, and PLA-based composites were scanned in the frequency range of 500 to 4000 cm⁻¹ at a resolution of 4 cm⁻¹ [7 (link)].

FTIR spectra of WFA, free NS and WFA-NS were obtained using KBr disk technique. The test sample was mixed with KBr powder to generate the KBr disc. The IRTracer-100 FTIR spectrophotometer ((Shimadzu IRPrestige-21, Tokyo, Japan) was used to measure the FTIR spectra (4000 to 400 cm^–1).

Attenuated total reflectance—Fourier transform infrared (ATR-FTIR) spectroscopy was used to investigate the chemical changes in the PLA matrix due to its potential interactions with POM after thermal processing. Spectra were obtained from two types of blank PLA films and two PLA–POM-containing films using an IRTracer-100 FTIR spectrophotometer (Shimadzu, Kyoto, Japan). This study was conducted in the 400–4000 cm⁻¹ range with a 2 cm⁻¹ resolution, and number of scans of 40.

The FTIR spectra were recorded on an attenuated total reflection Fourier transform infrared (ATR-FTIR) by Shimadzu IRTracer-100 FTIR Spectrophotometer (Tokyo, Japan) to examine the changes in functional groups induced by various treatments. The FTIR spectral analysis was performed within a range of 400–4000 cm⁻¹ with resolution of 4 cm⁻¹.

¹H NMR and ¹³C NMR spectra were recorded on a 500 MHz Varian/Oxford As-500 spectrometer. Chemical shifts were referenced to internal standard of tetramethylsilane (as δ = 0.00 ppm). High-resolution electrospray ionization (ESI) mass spectra were obtained on a Thermo Scientific LTQ Orbitrap XL mass spectrometer. FT-IR spectra were recorded on a Shimadzu IRTracer-100 FT-IR Spectrophotometer. Electronic absorption spectra were recorded on an Agilent 8453 UV–vis spectrophotometer with ChemStation software. Fluorescence spectra were recorded on a Photon Technology International Quanta-Master 400 spectrofluorometer with FelixGX software. The quantum yields were determined by using an integrating sphere attached to the instrument. Time-resolved photoluminescence (PL) decay measurements were made on a Edinburgh FLS-920 equipped with a 450 nm diode laser (EPL-450).