Belsorp mini 2
The BELSORP-mini II is a compact and fully automated gas adsorption analyzer designed for the measurement of specific surface area, pore size, and pore volume of solid materials. It utilizes the volumetric gas adsorption technique to determine the physical properties of materials. The instrument is capable of analyzing a wide range of materials, including catalysts, adsorbents, powders, and porous solids.
Lab products found in correlation
22 protocols using belsorp mini 2
Physisorption Isotherm Analysis of Carbon Materials
Detailed Material Characterization Protocol
Characterization of Magnetite Nanoparticles
Comprehensive Characterization of Fe3O4@ZIF-8 Composites
Characterization of Fe(II)-Phthalocyanine Catalyst
Morphological and Chemical Characterization of AG/rGO
Nitrogen Adsorption-Desorption for Surface Area
Comprehensive Material Characterization Protocol
scanning transmission electron microscope (TEM) with a ZrO/W(100)
thermal field emission type at 200 kV was used for elemental mapping.
An FEI Tecnai TF30ST TEM with a ZrO/W(100) Schottky emitter at 300
kV was used to analyze material morphology. The sample powder was
diluted in ethyl alcohol via ultrasonication, and it was dried on
a TEM grid (Electron Microscopy Sciences, CF400-CU). A D8 Advanced
A25 (BRUKER) was used to measure powder X-ray diffraction (XRD). Fourier-transform
infrared spectroscopy (FTIR) was performed using a Nicolet iS5 FTIR
spectrometer (Thermo Fisher Scientific) with an iD7 ATR accessory.
A BELSORP-mini II (MicrotracBEL) was used to measure the Brunauer–Emmett–Teller
(BET) surface area. A TGA Q50 (TA Instruments) was used to perform
thermogravimetric analysis (TGA). The sample was heated to 1000 °C
by 10 °C/min under nitrogen. An AutoChem 2920 (Micromeritics,
USA) was used to measure ammonia temperature-programmed desorption
(TPD). Before analysis, the sample was dried in a vacuum oven at 200
°C for 6 h. Then, it was pretreated at 150 °C for 12 h under
a helium gas flow. The fraction of ammonia was 15% during adsorption
of ammonia at 40 °C for 1 h. The temperature during ammonia desorption
was raised to 150 °C by 10 °C/min.
Characterization of Nitrogen-Containing Thermoelectrics
analysis of NCT was performed using CHN
analyzers (CE440,
Exeter Analytical, Inc. and JM10, J-SCIENCE LAB Co., Ltd.) at the
Global Facility Center, Hokkaido University, Japan. For specific surface
area measurements of NC1223, the sample was pretreated
at 373 K under vacuum for 6 h, and then, the measurements were carried
out at 77 K using Belsorp-mini II (MicrotracBEL). Nitrogen was used
as the adsorptive gas. XPS data were collected at a pass energy of
10 eV using an Al X-ray source on a photoelectron spectrometer JPS-9200
(JEOL). The peak of C=C in the C 1s region was used as an internal
standard (284.7 eV) to calibrate the binding energies of the elements.
TEM images were taken by using JEM-2000FX (JEOL). HAADF–STEM
and EDS elemental mapping images were obtained using a JEOL JEM-ARM200F
instrument at 200 kV.
Nitrogen Adsorption-Desorption Isotherms Analysis
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