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Hybridsims instrument

Manufactured by ION-TOF

The HybridSIMS instrument is a surface analysis tool that combines secondary ion mass spectrometry (SIMS) and other analytical techniques to provide detailed information about the chemical composition and structure of materials at the nanoscale level. The instrument is capable of performing high-resolution depth profiling and imaging analysis, allowing users to study the surface and subsurface properties of a wide range of materials.

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Lab products found in correlation

2 protocols using hybridsims instrument

1

High-Resolution Mass Spectrometry Imaging

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Mass spectrometry imaging was performed using a HybridSIMS instrument (ION-TOF GmbH) employing a 30 keV Bi3+ primary ion source (0.3 pA target current). In order to best accommodate sample topography, delayed extraction was used for analysis with nitrogen gas flooding. Data was acquired over a 200 × 200 µm2 area, with a resolution of 256 × 256 pixels with 20 shots per pixel. The data acquisition and analysis was performed with SurfaceLab7 (ION-TOF GmbH). Charge neutralisation was performed using a relatively low energy (< 2 eV) electron floodgun.
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2

3D OrbiSIMS Imaging of AMS Samples

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3D OrbiSIMS mass spectrometry imaging was performed using a HybridSIMS instrument (ION‐TOF GmbH) employing a 30 keV Bi3+ primary ion source (0.3 pA target current) in delayed extraction mode to analyze the AMS samples. Data was acquired over a 4 × 4 mm area, with a resolution of 100 pixels per mm with 15 shots per pixel. The data acquisition and analysis was performed with SurfaceLab7 (ION‐TOF GmbH). Charge neutralization was performed using a relatively low energy (<2 eV) electron floodgun.
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