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Asap 2460 surface

Manufactured by Micromeritics

The ASAP 2460 is a surface area and porosity analyzer that utilizes nitrogen adsorption to determine the surface area and pore size distribution of solid materials. It is designed to provide accurate and reproducible measurements of these important physical characteristics.

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2 protocols using asap 2460 surface

1

Structural and Luminescent Characterization of Eu^3+ doped UiO-66-(COOH)2 MOF

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The powder X-ray diffraction (PXRD) data were collected on a Miniflex 600 diffractometer at room temperature using Cu Kα radiation (λ = 0.15418 nm) with 15 mA, 40 kV, and a scan rate of 3° min−1 (2θ, 3–40°). The Fourier transform infrared (FT-IR) spectra were recorded in the wavenumber range of 4000–400 cm−1 by utilizing KBr pellets pressing method on a Thermo Fisher Nicolet 5700 spectrometer. ICP-MS was performed on Thermo Scientific XSERIES 2 inductively coupled plasma-mass spectrometry (ICP-MS) system. Nitrogen adsorption/desorption isotherms were tested at liquid nitrogen temperature using a Micromeritics ASAP 2460 surface area analyser. Prior to sorption measurements, the Eu3+@UiO-66-(COOH)2 was activated at 80 °C overnight. Surface areas of the products were calculated using the Brunauer–Emmett–Teller (BET) method. ICP-MS data were collected on a Thermo Scientific XSERIES 2 inductively coupled plasma-mass spectrometer. Luminescence excitation and emission spectra were conducted on a FluoroMax-4 spectrofluorometer at room temperature utilizing a 450 W xenon lamp as excitation source, and luminescence lifetimes (τ) measurements were taken with an Edinburgh FLS980 spectrophotometer.
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2

Comprehensive Characterization of ZnO Nanostructures

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The synthesised ZnO nanostructure morphology was confirmed using a JEM-2100 transmission electron microscope (TEM) and Vega 3 Tescan scanning electron microscope (SEM). The TEM and SEM electron microscopes also provided information about the structure, size, and complexity of the surfaces of all the nanomaterials in this investigation. The identity and purity information was acquired using a Phillips X-ray diffractometer from PANalytical (X’ Pert Pro core) using a 2ϴ scanning range of 5–90° with a Cu Kα (λ = 0.154 nm) radiation source. Chemical bonding within the nanomaterial was further explored using a Raman microscope (WITec alpha 300R confocal fluorescence microscopy, 532 nm wavelength) and an FTIR spectrometer from PerkinElmer (TL 8000 Balanced flow FT-IR EGA system spectrometer), and the obtained data were baseline-corrected and normalised. The synthesised materials’ band gap energy (e.g., eV) was determined using their diffuse reflectance spectra measured with a UV–Vis Spectrophotometer from Thermo Scientific (EvolutionPro). A Micromeritics ASAP 2460 surface area and porosity analyser was used to determine the surface area and porosity of the nanomaterial. X-ray photoelectron spectroscopy (XPS, XSAM800, Kratos, Manchester, UK) was used to determine the oxidation state and the elemental analysis.
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